Hitting The Power Integrity Wall At 10nm


At 10nm and beyond, the breakdown of some historic trends tied to Moore's Law is making it harder to fully harvest the benefits of scaling semiconductor technologies. Underlying the power, performance and area benefits of scaling are technological challenges that must be solved in order to make the semiconductor products a profitable business. Power-related challenges are among the most pres... » read more

Power Integrity Optimization Cuts RF Substrate Noise


Our main focus is on dynamic voltage drop at 16-14-10nm and beyond, but the rise of the Internet of Things (IoT) prompted me to share some silicon measurement results that are relevant to the RF design community. Normally, power integrity (PI) is looked at in the time domain, but in this work we looked at it from a frequency spectrum perspective. Silicon measurements prove how shaping the dynam... » read more