category: Videos

category: IoT, Security & Automotive

Secure Movement Of Data In Test
By Ed Sperling - 16 Apr, 2024 - Comments: 0

Historically, test data flowed out of the tester and was loaded into a file. But with heterogeneous integration, including chiplets and IP from multiple vendors, test data is now being streamed across the manufacturing floor where it can be used to make real-time decisions. Eli Roth, product manager for smart manufacturing at Teradyne, talks with Semiconductor Engineering about challenges in da... » read more

Challenges With Chiplets And Power Delivery
By Ed Sperling - 15 Apr, 2024 - Comments: 0

Chiplets hold the potential to deliver the same PPA benefits as an SoC, but with many more features and options that are possible on a reticle-constrained die. If chiplets live up to the hype, they will deliver what is essentially mass customization, democratizing and speeding the delivery of complex chips across a broad array of markets. Today, the focus has been on die-to-die interfaces, but ... » read more

Challenges In RISC-V Verification
By Ed Sperling - 02 Apr, 2024 - Comments: 0

Designing a single-core RISC-V processor is relatively easy, but verifying it and debugging it is a different story. And it all becomes more complicated when multiple cores are involved, and when those cores need to be cache-coherent. Ashish Darbari, CEO of Axiomise, talks with Semiconductor Engineering about using assertions and formal verification technology to find bugs and prove coherency i... » read more

Cache Coherency In Heterogeneous Systems
By Ed Sperling - 01 Apr, 2024 - Comments: 0

Until recently, coherency was something normally associated with DRAM. But as chip designs become increasingly heterogeneous, incorporating more and different types of compute elements, it becomes harder to maintain coherency in that data without taking a significant hit on performance and power. The basic problem is that not all compute elements fetch and share data at the same speed, and syst... » read more

Rethinking Chip Economics
By Ed Sperling - 20 Mar, 2024 - Comments: 0

As process nodes shrink, so does the selection of chips developed at those nodes. Consumers demand more features and functionality, but that carries a high price tag in terms of both complexity and real dollars. In addition, because costs are skyrocketing, there is growing pressure for those chips to remain reliable and up-to-date for longer periods of time. Jayson Bethurem, vice president of m... » read more

Cost And Quality Of Chiplets
By Ed Sperling - 19 Mar, 2024 - Comments: 0

Chiplets add a whole new challenge for the semiconductor industry. How much testing is enough? How do you optimize system binning? What’s the right amount of burn-in? The answers to these questions will vary, depending upon cost and quality tradeoffs, the number and source of the chiplets, and real-world workloads and projected lifespans. Marc Jacobs, senior director of solutions architectur... » read more

Changes And Challenges In Auto MCUs
By Ed Sperling - 13 Mar, 2024 - Comments: 0

Microcontrollers have been a key component in automotive for years, starting with single-core devices with limited on-chip memory for very basic functions, and evolving toward multi-core systems with more memory for more complex tasks. But as vehicles become increasingly automated, microcontrollers are changing significantly, and so is the perception of how to utilize them. These new devices ne... » read more

Integration Challenges For RISC-V Designs
By Ed Sperling - 27 Feb, 2024 - Comments: 0

One of the big draws of RISC-V is that it allows design teams to create unique chips or chiplets and to make modifications to the instruction-set architecture. That extra degree of freedom also creates some issues when it comes to integrating those designs into packages or systems because they may require non-standard connectivity approaches. Frank Schirrmeister, vice president of marketing at ... » read more

New Issues In Power Semiconductors
By Ed Sperling - 26 Feb, 2024 - Comments: 0

The number of challenges is growing in power semiconductors, just as it is in traditional chips. Thermal dissipation and gradients, new design rules, and layout issues need to be considered, especially in the context of higher voltage and increased performance demands. Roland Jancke, design methodology head in Fraunhofer IIS’ Engineering of Adaptive Systems Division, talks about issues in int... » read more

Yield Tracking In RDL
By Ed Sperling - 07 Feb, 2024 - Comments: 0

Yield is a much bigger issue when it comes to panel-level packages, which may contain up to 24 RDL layers. Just finding the defects is a massive challenge, let alone understanding how they will impact the entire device. Many of these advanced packages are being used in data centers for generative AI, and killer defects caused by bridges and opens can cause serious problems. What happens, for in... » read more

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