Expose Transistor-Level Yield Limiters With Cell-Aware Diagnosis

A new method to identify defects inside standard cells.

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Cell-aware diagnosis is a new and effective method to perform transistor-level diagnosis to identify defects inside standard cells. It leverages fault models derived from analog simulation and uses a fail data collection and diagnosis flow identical to that of traditional diagnosis. Cell-aware diagnosis in Tessent Diagnosis is the result of over 10 years of research in cell-aware test and was developed in collaboration with fabless semiconductor manufacturers, foundries, and integrated device manufacturers.

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