Best practices for improving gate-level simulation performance at 40nm and below, including new simulator use models and methodologies.
The increase in design sizes and the complexity of timing checks at 40nm technology nodes and below is responsible for longer run times, high memory requirements, and the need for a growing set of gate-level simulation (GLS) applications including design for test (DFT) and low- power considerations. As a result, in order to complete the verification requirements on time, it becomes extremely important for GLS to be started as early in the design cycle as possible, and for the simulator to be run in high-performance mode. This application note describes new methodologies and simulator use models that increase GLS productivity, focusing on two techniques for GLS to make the verification process more effective.
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