What’s The Outlook For ICs?


As the semiconductor industry heads into the second half of 2016, it’s time to take the pulse of the IC sector. Based on the current signs, there’s a faint pulse, if that. Simply put, the IC market has been in the doldrums in the first half of 2016. And it looks sluggish heading into the second half. It wasn’t supposed to be like this. At the beginning of this year, many predicte... » read more

A Primer For The 802.XX Physical Layer


This is the second installment of the 802.XX for the IoE series of articles. The first one was published in the August issue and addressed the Media Access Control (MAC) layer. In this article, we will examine the elements of the physical (PHY) layer of the 802.11 protocol stack. For reference, the protocol stack is shown in figure 1. The best designs, like everything else, are built on a so... » read more

802.XX And The IoE


Ever since the first 802.11 standard was published in 1997, it has evolved to become the de facto protocol for much of the wireless networking across a wide range of devices and implementations. Today the protocol family includes 802.b 802.11a, 802.11g, 802.11n, and 802.11ac, respectively. Some of these will play a very important role in the IoE. There are other 802.xx protocols (such as 802.15... » read more

Wireless Technologies For The IoE


It's generally understood the [getkc id="76" kc_name="Internet of Everything"] eventually will be the interconnect platform of all things, wireless and wireline. The utopian scenario is to have a common platform, with standardized protocols, which everyone builds to. Will that happen? Perhaps, but for a time, especially while the IoE evolves, that won’t be the case. Count on the early IoE bei... » read more

How To Test IoT Devices


At a recent event, test experts said the IC industry needs a new paradigm in testing chips for the [getkc id="76" comment="Internet of Things"] (IoT). The message was fairly simple to interpret. Existing automatic test equipment (ATE) is well suited to test today’s digital, analog, and mixed-signal chips, though it may be ill-equipped or too expensive to test IoT-based devices. But wha... » read more