Week In Review: Manufacturing, Test


The coronavirus (COVID-19) continues to have an impact on most, if not all, industries. This includes the electronics, semiconductor and related segments. International Data Corp. (IDC) has released a report on the company’s view on the impact the COVID-19 virus will have on the semiconductor market. The report provides a framework to evaluate the market impact through four scenarios. "... » read more

A Brief History of Test


The history of semiconductor test systems is the subject of this blog post. We’ll turn to printed circuit board testing at another time. Boston-based Teradyne sold its D133 diode tester to Raytheon in 1961. Five years later, it introduced the J259 integrated circuit tester, which had a minicomputer to run the test programs. For many, this marks the beginning of automatic (or automated) tes... » read more

Logic Analyzers Never Die


Logic analyzers, long a mainstay of chip design, are finding new demand for IoT devices—and frequently in different forms than in the past. Once associated with big, bulky benchtop instruments, this technology has evolved significantly over the past 40 years. In some cases it has been moved into software, where the measurement results are more likely to be viewed upon a laptop screen or a ... » read more

Chip Advances Play Big Role In Cloud


Semiconductor engineering teams have been collaborating with key players in the data center ecosystem in recent years, resulting in unforeseen and substantial changes in how data centers are architected and built. That includes everything from which boxes, boards, cards and cables go where, to how much it costs to run them. The result is that bedrock communication technology and standards li... » read more

The Week In Review: Manufacturing


At an event, Samsung rolled out its 10nm finFET technology. The company also showed a 300mm wafer with 10nm finFET transistors. "We have silicon-based PDKs out," said Kelvin Low, senior director of foundry marketing for Samsung. Samsung plans to move into production with its 10nm finFET technology by the end of 2016, he said. IC Insights released its chip rankings in terms of sales in the fi... » read more

The Week In Review: Manufacturing


Suppliers in the automotive semiconductor market experienced exceptional growth in 2014, according to IHS. Based on final analysis of the 2014 results, Renesas maintained its leadership position as the number one supplier in 2014, according to the rankings. “For 2015, IHS expects to see a shift among the leading suppliers in this category, given the recent merger of Freescale and NXP, two lar... » read more

The Week In Review: Manufacturing And Design


Crucial.com reveals a surprising way to gain more time for improving one's personal health: fix a slow computer. A nationwide survey revealed that U.S. adults think they waste an average of 16 minutes per day waiting for their computer to load or boot up. Equating to two hours each week and four days per year lost to the wiles of a slow computer, it's no surprise that 66% of Americans say that ... » read more

Defective R&D Funding Models


For years, the semiconductor equipment industry has been dealing with an R&D funding gap. Here’s the basic problem: Chipmakers demand certain tools for their next-generation processes, but they are not always willing to foot a large percentage of the R&D bill. And so, the equipment vendors develop the tools and assume a large part of R&D funding--and the risks. Fair or unf... » read more

FD-SOI Workshop ppts – STM’s 1st 28nm FD-SOI product line


The SOI Consortium’s 6th FD-SOI workshop, held just after ISSCC, yielded some exciting news. Most of the presentations are freely available for downloading from the SOI Consortium website. Here are the highlights. STMicroelectronics In a terrific presentation by Giorgio Cesana, Marketing Director at STMicroelectronics, he revealed that the company would be releasing a major product line b... » read more

The Abstraction of Test


By Ann Steffora Mutschler By now, semiconductor design abstraction is old hat to many engineers, but mention the term “semiconductor test abstraction” and expect a blank stare in return. Design complexity, enormous design size, and short market windows have put tremendous pressure on test to occur earlier rather than later. Even at the RTL level, where hardware test typically has not ... » read more

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