The Week In Review: Manufacturing


Materials and equipment A scandal has rocked Japan’s Kobe Steel. The company disclosed that it has falsified inspection data for iron powder, aluminum and copper products that were sent to over 200 customers in the automotive, electronics, transportation and other sectors. The falsified data involves 20,000 tones of products, according to reports. Kobe apologized for the issues and provided ... » read more

Improving Yield, Reliability With Data


Big data techniques for sorting through massive amounts of data to identify aberrations are beginning to find a home in semiconductor manufacturing, fueled by new requirements in safety-critical markets such as automotive as well as the rising price of packaged chips in smartphones. Outlier detection—the process of finding data points outside the normal distribution—isn't a new idea. It ... » read more

The 2017 International Test Conference


Machine learning is a hot topic at many technical conferences this year. It will be true at the upcoming International Test Conference, which opens near the end of this month in Fort Worth, Texas. On Sunday, October 29, there are two tutorials devoted to machine learning. Monday, October 30, will have one tutorial related to the topic. The conference gets fully under way on Halloween, wit... » read more

Toward System-Level Test


The push toward more complex integration in chips, advanced packaging, and the use of those chips for new applications is turning the test world upside down. Most people think of test as a single operation that is performed during manufacturing. In reality it is a portfolio of separate operations, and the number of tests required is growing as designs become more heterogeneous and as they ar... » read more

The Week In Review: Manufacturing


Test, measurement and fab tools National Instruments (NI) has released a report that explores the future trends in the electronics industry. The report, called the NI Trend Watch 2018, looks at the technological advances and some of the biggest challenges engineers face in 2018. The report from NI looks at the following topics—machine learning; test challenges for 5G; IIoT; and effects of... » read more

How To Make Autonomous Vehicles Reliable


The number of unknowns in automotive chips, subsystems and entire vehicles is growing as higher levels of driver assistance are deployed, sparking new concerns and approaches about how to improve reliability of these systems. Advanced Driver Assistance Systems (ADAS) will need to detect objects, animals and people, and they will be used for parking assistance, night vision and collision avoi... » read more

Astronics Ballard Technology OmniBus II PXI Express Product for Avionics Test


The OmniBus II PXIe databus interface products combine the standard PXIe interface with MIL-STD-1553 and ARINC 429 Avionics Data Bus interfaces. Interface cards can be ordered with either MIL-STD-1553 only, ARINC 429 only, or both interfaces on the same card. The PXIe interface includes a PCIe x1 interface to the controller as well as support for PXI clock, timing and trigger signals. The inclu... » read more

The Week In Review: Manufacturing


Chipmakers Toshiba is still looking for a buyer for its prized NAND flash memory business. The leading contenders for the business are a consortium with Western Digital. Meanwhile, Toshiba’s memory unit is expanding its Fab 6 facility at its Yokkaichi Operations, based in Japan. And now, it has selected a site for its next fab in Japan, this time in Kitakami City, Iwate. Construction is expe... » read more

Advanced Packaging Moves To Cars


By Ann Steffora Mutschler and Ed Sperling As automotive OEMs come up to speed on electrification of vehicles, each at their own pace, they are starting to embrace novel packaging approaches as a way to differentiate themselves in an increasingly competitive market. Wirebond used to dominate this market, where most of the chips were relatively unsophisticated and product cycles were slow... » read more

Astronics Test Systems And Tabor Electronics End Obsolescence For NAVAIR


Obsolescence. This is not a favorite word for most end users. Flexibility, options, extended product life – those words bring relief to the testing environments of end users. Yet, nonetheless, obsolescence is a factor that must be faced within the testing industry. When the US Naval Air Systems Command (NAVAIR) faced obsolescence with a major Test & Measurement OEM, they turned to Astr... » read more

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