10 Common Device Noise Analysis Mistakes

Device noise is critical in nanometer-scale CMOS processes, and it fundamentally limits the performance of many circuits at 45 nm and below. Given the right tools, device noise analysis (DNA) is a fairly straightforward process that should produce results that are within 1 dB to 2 dB of silicon measurements. However, there are a number of common mistakes that can lead to grossly overestimating ... » read more