Design For Reliability


By Arvind Shanmugavel Faster processors, lowered power targets and shrinking technology have increased the complexity of integrated circuit (IC) reliability analysis. With the 20nm node becoming mainstream, IC design teams are fast re-tooling their analysis methodologies to simulate and capture various reliability failure mechanisms. Electromigration (EM) analysis, thermal analysis and Electro... » read more

Making Quality A Top Priority in Next-Generation Designs


By Cheryl Ajluni With system design such a complicated task these days, it is increasingly likely that designers will inadvertently overlook some details of the design process, or worse yet, simply not have the time to address them adequately. Time is readily spent focusing on things like performance, area, timing, and power, but what about something a bit more esoteric in nature—namely, qu... » read more