Outlier Detection


With increasing focus on quality and reliability across all segments beyond just automotive, medical and mil-aero, it is more critical than ever for companies to leverage every byte of test data at their disposal to ensure that they deliver the lowest possible DPPM (defective parts per million) rates to their customers. Semiconductor manufacturing operations now generate up to 100TB of test ... » read more

How Much Testing Is Enough?


As chipmakers move towards finer geometries, IC designs are obviously becoming more complex and expensive. Given the enormous risks involved, chipmakers must ensure the quality of the parts before they go out the door. And as part of quality assurance process, that requires a sound test strategy. But for years, IC makers have faced the same dilemma. On one hand, they want a stringent test me... » read more