The Power Of De-Integration


The idea that more functionality can be added into a single chip, or even into a single system, is falling out of vogue. For an increasing number of applications, it's no longer considered the best option for boosting performance or lowering power, and it costs too much. Hooman Moshar, vice president of engineering at Broadcom, said in a keynote speech at Mentor's User2User conference this w... » read more

Early Chip-Package-System Thermal Analysis


Next-generation automotive, HPC and networking applications are pushing the requirements of thermal integrity and reliability, as they need to operate in extreme conditions for extended periods of time. FinFET designs have high dynamic power density, and power directly impacts the thermal signature of the chip.┬áThermal degradation typically occurs over an extended period of chip operation. ... » read more

Functional Safety Methodologies For Automotive Applications


Safety-critical automotive applications have stringent demands for functional safety and reliability. Traditionally, functional safety requirements have been managed by car manufacturers and system providers. However, with the increasing complexity of electronics involved, the responsibility of addressing functional safety is now propagating through the supply chain to semiconductor companies a... » read more

Multiphysics Reliability Signoff For Next-Gen Auto Electronics Systems


The automotive industry is in the midst of a sea change. Growing market needs for electrification, connectivity on the go, advanced driver assistance systems, and ultimately the goal of autonomous driving, are creating newer requirements and greater challenges. A chassis on four wheels is now fitted with cameras, radar and other sensors, which will be the eyes of the driverless car, as well as ... » read more

Tech Talk: 5/3nm Parasitics


Ralph Iverson, principal R&D engineer at Synopsys, talks about parasitic extraction at 5/3nm and what to expect with new materials and gate structures such as gate-all-around FETs and vertical nanowire FETs. https://youtu.be/24C6byQBkuI » read more

Chip Aging Accelerates


Reliability is becoming an increasingly important proof point for new chips as they are rolled out in new markets such as automotive, cloud computing and industrial IoT, but actually proving that a chip will function as expected over time is becoming much more difficult. In the past, reliability generally was considered a foundry issue. Chips developed for computers and phones were designed ... » read more

New Thermal Issues Emerge


Thermal monitoring is becoming more critical as gate density continues to increase at each new node and as chips are developed for safety critical markets such as automotive. This may sound counterintuitive because the whole point of device scaling is to increase gate density. But at 10/7 and 7/5nm, static current leakage is becoming a bigger issue, raising questions about how long [getkc id... » read more

Pushing Performance Limits


Trying to squeeze the last bit of performance out of a chip sounds like a good idea, but it increases risk and cost, extends development time, reduced yield, and it may even limit the environments in which the chip can operate. And yet, given the amount of margin added at every step of the development process, it seems obvious that plenty of improvements could be made. "Every design can be o... » read more

Tech Talk: Applying Machine Learning


Norman Chang, chief technologist at ANSYS, talks about real applications of machine learning for mechanical, fluid dynamics and chip-package-system design. https://youtu.be/MqYX0wbwSfE » read more

The Week In Review: Design


M&A Synopsys finalized its acquisition of Black Duck Software, which provides software for managing and securing open source software in projects, adding to Synopsys' burgeoning software analysis and security business. The cash deal was approximately $547 million net of cash acquired. STMicroelectronics acquired Atollic, maker of the Eclipse-based TrueSTUDIO Integrated Development Envir... » read more

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