Tech Talk: 14nm


Tamer Ragheb, digital design methodology technical lead at GlobalFoundries about what's changed with 14nm finFETs, including coloring with double patterning, new corners, Miller Effects, timing issues and variability. [youtube vid=Yk6jSKCtsjU] » read more

Designing And Testing FinFET-based IC Designs


By Carey Robertson and Steve Pateras The emergence of FinFET transistors has had a significant impact on the IC physical design and design-for-test flows. The introduction of FinFETs means that CMOS transistors must be modeled as three-dimensional (3D) devices during the IC design process, with all the complexity and uncertainty this entails. The BSIM Group of the UC Berkeley Device Group has ... » read more

Power Grid Analysis


By Christen Decoin With increasing design size at each technology node, power grid analysis (PGA) has been stretching established software capacity and performance for some time. At 32/28nm, capacity and performance issues finally presented significant barriers to achieving signoff. In this article, we explore existing approaches that EDA vendors have been trying to leverage to work around ... » read more

Experts At The Table: The Growing Signoff Headache


By Ed Sperling Low-Power/High-Performance Engineering sat down to discuss signoff issues with Rob Aitken, an ARM fellow; Sumbal Rafiq, director of engineering at Applied Micro; Ruben Molina, product marketing director for timing signoff at Cadence; Carey Robertson, director of product marketing for Calibre extraction at Mentor Graphics; and Robert Hoogenstryd, senior director of marketing for ... » read more

Extraction, Power And Final Silicon


By Ann Steffora Mutschler As semiconductor technology scales down, manufacturing effects are coming front and center, putting constant pressure on design teams to make sure that silicon can be modeled through the extraction process while performing analysis accurately. Extraction technology is one of the basic components needed to gain an accurate measurement of power, timing and signal int... » read more