Closing The Power Integrity Gap


Voltage drop has always been a significant challenge. As far back as 130nm, specialist tools were being used to ensure that enough local decoupling capacitance (decap) cells were inserted in addition to larger decaps implemented around the SoC. But advanced nodes are complicating matters and further increasing complexity. These technological challenges, which underlie the power, performance ... » read more

Analyzing The Integrity Of Power


Power analysis is shifting much earlier in the chip design process, with power emerging as the top design constraint at advanced process nodes. As engineering teams pack more functionality and content into bigger and more complex chips, they are having to deal with more complex interactions that affect everything from power to its impact on signal integrity and long-term reliability. That, i... » read more

Accurate Thermal Analysis, Including Thermal Coupling Of On-Chip Hot Interconnect


Driven by rapid advancement in mobile/server computing and automotive/communications, SoCs are experiencing a fast pace of functional integration along with technology scaling. Advanced low power techniques are widely used, while meeting higher performance requirements using a variety of packaging technologies. The Internet of Things (IoT) is further opening up new applications with connected d... » read more

Thermal Is Still Simmering


With the ever increasing sophistication in today’s high-performance [getkc id="81" kc_name="SoC"]s on top of sheer physics of device manufacturing, thermal is a much bigger concern than ever before. It is well understood that thermal and power are closely related, and there exists a vicious cycle between leakage power and temperature: leakage goes up, temperature goes up; temperature goes ... » read more

The Week In Review: Design


Tools Cadence rolled out a custom power integrity tool for dealing with transistor-level electromigration and IR drop with SPICE-level accuracy. It works in conjunction with the company’s existing power integrity tool for cell-level power signoff. Open-Silicon established a high-speed SerDes technology center of excellence to speed design and production of ASICs using high-speed serial co... » read more

Changing The Meaning Of Sign-Off


Chip development teams are faced with an ever-increasing number of power integrity and reliability challenges these days, especially as designs adopt FinFET technology. Even those with the most thorough sign-off checks often encounter unexpected surprises that quickly turn into tape-out hurdles, or worse yet, extensive re-design. The best way to avoid this scenario and ensure a smoother sign-of... » read more

The Week In Review: Oct. 18


By Mark LaPedus & Ed Sperling The problems continue with extreme ultraviolet (EUV) lithography. ASML promised to deliver an 80 Watt power source by year’s end. Now, the company said it only will have a 70 Watt source by mid-2014. “We are focusing on reaching the 70 Watts by the middle of next year,” said Peter Wennink, ASML’s CEO, in a conference call to discuss the company’s res... » read more

Bringing Electrical Info To Design’s Forefront


By Ann Steffora Mutschler To reflect the impact on transistors of smaller process nodes and the electrical effects that occur as a result, a shift is underway where the electrical analysis and verification that used to be done when the layout was complete is moving earlier in the design process. The analysis includes parasitic extraction of interconnect and device parasitics, electromigrati... » read more