Soft Errors Create Tough Problems

By Ed Sperling Single event upsets used to be as rare as some elements on the Periodic Table, with the damage they could cause relegated more to theory than reality. Not anymore. At 90nm, what was theory became reality. And at 45nm, the events are becoming far more common, often affecting multiple bits in increasingly dense arrays of memory and now, increasingly, in the logic. Known alter... » read more