How Reliable Are FinFETs?


Stringent safety requirements in the automotive and industrial sectors are forcing chipmakers to re-examine a number of factors that can impact reliability over the lifespan of a device. Many of these concerns are not new. Electrical overstress (EOS), electrostatic discharge (ESD) and [getkc id="160" kc_name="electromigration"] (EM) are well understood, and have been addressed by EDA tools f... » read more

Using CNNs To Speed Up Systems


Convolutional neural networks (CNNs) are becoming one of the key differentiators in system performance, reversing a decades-old trend that equated speed with processor clock frequencies, the number of transistors, and the instruction set architecture. Even with today's smartphones and PCs, it's difficult for users to differentiate between processors with 6, 8 or 16 cores. But as the amount o... » read more

Addressing The Complex Challenges In Low-Power Design And Verification


This paper provides a comprehensive analysis of various complex debug problems faced in low-power design and verification. By using relevant examples it demonstrates how these issues can be either avoided or easily solved. We will also highlight some of the common pitfalls that low-power designers can avoid, which otherwise can lead to complex low-power issues that are difficult to debug at lat... » read more

Dealing With System-Level Power


Analyzing and managing power at the system level is becoming more difficult and more important—and slow to catch on. There are several reasons for this. First, design automation tools have lagged behind an understanding of what needs to be done. Second, modeling languages and standards are still in flux, and what exists today is considered inadequate. And third, while system-level power ha... » read more

Performance To The People


Ever since the IoT became a household term, the almost universal concept was that extremely low-power, simplistic devices would rule the edge. They would collect data, send it to the cloud, and the cloud would send back useful information. That's a great marketing concept for gateways and cloud services, but it's not scalable. Consumers don't just want to know when their heartbeat is irregul... » read more

Tech Talk: ADAS


Arvind Vel, director of applications engineering at ANSYS, talks about the transition to self-driving cars and what will be required in future system designs. https://youtu.be/K2xBZZ-vxYQ » read more

Verification Unification


Semiconductor Engineering brought together industry luminaries to initiate the discussion about the role that formal technologies will play with the recently released early adopter's draft of Portable Stimulus and how it may help to bring the two execution technologies closer together. Participating in this roundtable are Joe Hupcey, verification product technologist for [getentity id="22017" e... » read more

Tech Talk: 7nm Power


Annapoorna Krishnaswamy, lead applications engineer at ANSYS, talks with Semiconductor Engineering about power-related changes at 7nm and what engineering teams need to watch out for as they move down to the latest process technology. https://youtu.be/Ym46ssJPeHM » read more

Modeling On-Chip Variation At 10/7nm


Simulation, a workhorse tool for semiconductor design, is running out of steam at 10/7nm. It is falling behind on chips with huge gate counts and an enormous number of possible interactions between all the different functions that are being crammed onto a die. At simulation's root is some form of SPICE, which has served as its underpinnings ever since SPICE was first published 44 years ago. ... » read more

Saving Power In A UFS Implementation Leveraging MIPI M-PHY And UniPro


The JEDEC Universal Flash Storage (UFS) has become the mobile storage standard of choice for today’s high-end smartphones and tablets mainly due to the specification’s performance and power advantages over other existing solutions. These advantages become critical to meet end users’ requirements for higher responsiveness and increased capabilities. For example, end users expect to transmi... » read more

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