Bridging Machine Learning’s Divide


There is a growing divide between those researching [getkc id="305" comment="machine learning"] (ML) in the cloud and those trying to perform inferencing using limited resources and power budgets. Researchers are using the most cost-effective hardware available to them, which happens to be GPUs filled with floating point arithmetic units. But this is an untenable solution for embedded infere... » read more

PowerDown: Power Efficiency


Power Down Semiconductor wants to make the batteries in smartphones and IoT devices last 10 times longer by not wasting power they’ve already used. Every time an intelligent device has a thought, it pulls power from a battery and sends it through its maze of wires and millions of gates to create a O or a 1 at key points in the control and logic circuits. “Think about how much energy... » read more

The Implementation Of Embedded PVT Monitoring Subsystems In Today’s Cutting Edge Technologies


This new whitepaper from Moortec takes a comprehensive look at the Implementation of Embedded PVT Monitoring Subsystems in Today’s Cutting Edge Technologies and how this can benefit today’s advanced node semiconductor design engineers by improving the performance and reliability of SoC designs. With advances in CMOS technology, and the scaling of transistor channel lengths to nanometer (nm)... » read more

Tech Talk: Near-Threshold Power


Lauri Koskinen, CTO and founder of Minima Processor, and Ron Moore, vice president of marketing at ARM, talk about near-threshold computing, dynamic power and margining, and how these techniques can extend battery life and reduce energy consumption. https://youtu.be/BhiNFe4NYQU » read more

Lots Of Little Knobs For Power


Dynamic power is becoming a much bigger worry at new nodes as more finFETs are packed on a die and wires shrink to the point where resistance and capacitance become first-order effects. Chipmakers began seeing dynamic power density issues with the first generation of [getkc id="185" kc_name="finFETs"]. While the 3D transistor structures reduced leakage current by providing better gate contro... » read more

Tech Talk: eFPGA LUTs


Cheng Wang, Flex Logix's senior vice president of engineering, explains how to use lookup tables in embedded FPGAs and which number of inputs is best for which application. https://youtu.be/ScnIbCOLcP4 » read more

Body Bias: What It Is, And Why You Should Care


In case you hadn’t noticed, the use of integrated circuits (ICs) has exploded over the past decade. From the cheapest novelty toy to automobiles to implanted medical devices, it seems like everything we touch has an electronic component in it somewhere. Not surprisingly, that growth has brought with it a vastly expanded number and variety of IC design requirements that design companies must s... » read more

Automated Body Bias Validation For High Performance, Low Power Electronics


Using a device’s body bias effect allows designers to tune a circuit’s behavior to meet both power and performance specifications, but getting it right isn’t always easy. Accurate, fast, automated body bias verification is critical to ensure today’s complex designs meet demanding performance, reliability, and power usage specifications. To read more, click here. » read more

Synthesis Of Energy-Efficient FSMs Implemented In PLD Circuits


The paper presents an outline of a simple synthesis method of energy-efficient FSMs. The idea consists in using local clock gating to selectively block the clock signal, if no transition of a state of a memory element is required. The research was dedicated to logic circuits using Programmable Logic Devices as the implementation platform, but the conclusions can be applied to any synchronous ci... » read more

Tech Talk: 7nm Thermal Effects


ANSYS' Karthik Srinivasan talks about the effect of heat on reliability at advanced process nodes, including self-heating, circuit aging, and how that will affect automotive electronics. https://youtu.be/SS6iAXp0Kn8   Related Tech Talk: 7nm Power Dealing with thermal effects, electromigration and other issues at the most advanced nodes. » read more

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