The Week In Review: Manufacturing


Fab and test equipment The wafer inspection market is heating up. For example, Applied Materials announced its new e-beam inspection system for use in foundry, logic, DRAM and 3D NAND applications. In addition, KLA-Tencor introduced six wafer defect inspection and review systems for leading-edge IC device manufacturing. National Instruments has rolled out a second-generation vector sig... » read more

Fab Tool Biz Faces Challenges In 2015


After a slight downturn in 2013, the semiconductor equipment industry rebounded and experienced a solid upturn in 2014. The recovery was primarily driven by tool spending in the foundry and [getkc id="93" kc_name="DRAM"]sectors. Another big and ongoing story continued to unfold in 2014. In late 2013, [getentity id="22817" e_name="Applied Materials"] announced a definitive agreement to acquir... » read more