Ultra-Thin Substrate Assembly Challenges For Advanced Flip Chip Package


Advanced semiconductor packaging requirements for higher and faster performance in a thinner and smaller form factor continues to grow for mobile, network and consumer devices. While the increase in device input/output (I/O) count is driven by the famous “Moore’s Law”, the packaging industry is experiencing opposing trends for more complex packaging solutions while the expected cost targe... » read more

Memory Directions Uncertain


Semiconductor Engineering sat down with a panel of experts to find out what is happening in world of memories. Taking part in the discussion are [getperson id="11073" comment="Charlie Cheng"], chief executive officer at [getentity id="22135" e_name="Kilopass Technology"]; Navraj Nandra, senior director of marketing for Analog/Mixed signal IP, embedded memories and logic libraries at [getentity ... » read more

Mobile Packaging Market Heats Up


Apple, Samsung and others are developing the next wave of smartphones and tablets. OEMs want to cram more chip functions in smaller IC packages, but there are some challenges in the arena. In fact, there are signs that the mainstream packaging technology for mobiles is running out of steam. For some time, mobile products have incorporated a technology called package-on-package (PoP), which u... » read more

Improve Logic Test With A Hybrid ATPG/BIST Solution


Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a passionate debate between some DFT practitioners about which is the best test method— ATPG or BIST. ATPG has been dominant for years, and is now used for full-chip test across the electronics indu... » read more