System Bits: Nov. 14


Tracking cyber attacks According to Georgia Tech, assessing the extent and impact of network or computer system attacks has been largely a time-consuming manual process, until now since a new software system being developed by cybersecurity researchers here will largely automate that process, allowing investigators to quickly and accurately pinpoint how intruders entered the network, what data... » read more

Manufacturing Bits: Oct. 24


Redefining unit measurements At a recent meeting, the International Committee for Weights and Measures (CIPM) took the next step towards the expected redefinition of four base units within the International System of Units (SI). The SI base units include the following metrics or constants--meter, kilogram, second, ampere, kelvin, mole, and the candela. Here’s the fundamental constant... » read more

System Bits: Oct. 24


Optical communication on silicon chips With the huge increase in computing performance in recent decades achieved by squeezing ever more transistors into a tighter space on microchips, at the same time this downsizing has also meant packing the wiring within microprocessors ever more tightly together. This has led to effects such as signal leakage between components, which can slow down commun... » read more

Manufacturing Bits: Oct. 3


Making buckypaper The Masdar Institute of Science and Technology has developed a process that will transform carbon nanotube powder into so-called buckypaper. Buckypaper is a thin sheet made from carbon nanotubes. They are sometimes known as multi-walled carbon nanotube sheets. Meanwhile, carbon nanotubes are tube-shaped materials, which are 100,000 times smaller than the diameter of human ... » read more

Manufacturing Bits: Sept. 19


Ion implant lithography At a recent conference, the University of California at Berkeley presented more details about its efforts to develop a multiple patterning method using tilted ion implantation (TII) technology. TII is somewhat similar today’s self-aligned double patterning (SADP) processes in logic and memory. SADP and the follow-on technology, self-aligned quadruple (SAQP), enable... » read more

Manufacturing Bits: July 18


Brain microscopes Rice University is developing a tiny and flat microscope for a special application--it will be able to decode and trigger neurons on the surface of the brain. The microscope technology, dubbed FlatScope, is part of a $65 million program announced by the U.S.-based Defense Advanced Research Projects Agency (DARPA). The DARPA project, dubbed Neural Engineering System Design ... » read more

Manufacturing Bits: June 20


Solar cell metrology Using atomic force microscopy (AFM), the National Institute of Standards and Technology (NIST) has developed a pair of novel techniques to measure the chemical compositions and defects in solar cells. The new techniques will give researchers insights into a thin-film solar cell material called cadmium telluride. The technology will also suggest ways to boost the efficie... » read more

Manufacturing Bits: May 23


Pushing optical metrology The University of Illinois at Urbana-Champaign has developed a new way to determine crystal types using optical metrology techniques. Using an optical-based technique called absorption spectroscopy, researchers have detected tiny nanocrystals down to about 2nm resolutions. Absorption spectroscopy measures the absorption of radiation. It is measured as a function o... » read more

Manufacturing Bits: Feb. 28


‘Big G’ gravitation measurements The National Institute of Standards and Technology (NIST) has unveiled a new coordinate measuring machine (CMM). The CMM, dubbed Xenos, makes measurements that involve “big G” or the universal constant of gravitation. Basically, there are two meanings for the constant of gravity. The first is Newton’s universal law of gravitation. For this, the spe... » read more

Manufacturing Bits: Feb. 21


AFM-on-a-chip An atomic force microscope (AFM) is a metrology tool that can measure and characterize structures in three dimensions. It uses a tiny probe to enable measurements in chip structures, but the instrument itself is often a large and bulky system. In response, the University of Texas at Dallas has devised an AFM-on-a-chip technology. The AFM is roughly the size of a dime. Based on... » read more

← Older posts