10 Common Device Noise Analysis Mistakes

Device noise is critical in nanometer-scale CMOS processes, and it fundamentally limits the performance of many circuits at 45 nm and below. Given the right tools, device noise analysis (DNA) is a fairly straightforward process that should produce results that are within 1 dB to 2 dB of silicon measurements. However, there are a number of common mistakes that can lead to grossly overestimating ... » read more

Analog FastSpice Platform Full-Spectrum Sampled Periodic Noise Analysis

Many high-performance analog/mixed-signal ICs include track-and-hold circuits to sample analog signals at one or more discrete timepoints per period. Although track-and-hold circuits are periodic, traditional periodic noise (pnoise) analysis does not apply because it measures the device noise impact integrated over an entire period rather than at instantaneous time points within the target peri... » read more

Efficient Noise Analysis For Complex Non-Periodic Analog/RF Blocks

Noise minimization is a required design objective for advanced analog and RF circuits. Unlike digital circuits, where noise is a second-order effect, noise in analog and RF circuits directly affects system performance metrics such as signal to noise ratio (SNR) and bit error rate (BER). Effective design optimization in the presence of random device noise is challenging because the noise sources... » read more