SCREAMER: A Demonstrator Chip For Spectral Noise Optimization By Clock Latency Scheduling

This paper outlines the design and measurement of a 130 nm test chip named SCREAMER for reducing the digital switching noise in synchronous circuits. Clock latency scheduling has been investigated as a means to optimize switching noise in the frequency domain through PDN simulation. Integrated in parallel on the chip are four instances of a test design, each addressing a distinct strategy of cl... » read more