Mention Design for Test (DFT) and scan chains come to mind, but there is much more to it than that—and the rules of the game are changing.
New application areas such as automotive may breathe new life into built-in self-test (BIST) solutions, which could also be used for manufacturing test. So could DFT as we know it be a thing of the past? Or will it continue to have a role to play?
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