AI/ML Challenges In Test and Metrology


The integration of artificial intelligence and machine learning (AI/ML) into semiconductor test and metrology is redefining the landscape for chip fabrication, which will be essential at advanced nodes and in increasingly dense advanced packages. Fabs today are inundated by vast amounts of data collected across multiple manufacturing processes, and AI/ML solutions are viewed as essential for... » read more

Chip Industry Week In Review


By Adam Kovac, Gregory Haley, and Liz Allan. Cadence plans to acquire BETA CAE Systems for $1.24 billion, the latest volley in a race to sell multi-physics simulation and analysis across a broad set of customers with deep pockets. Cadence said the deal opens the door to structural analysis for the automotive, aerospace, industrial, and health care sectors. Under the terms of the agreement, 6... » read more

Blog Review: Mar. 6


Synopsys' Gandharv Bhatara notes that successfully deploying high-NA EUV will rely on computational lithography to provide accurate modeling of aberrations, compact 3D mask modeling, and expand inverse lithography to full-chip processing. Cadence's John Park argues for using a systematic and automated system for co-design and co-analysis of multi-die packages to reduce the margin for human e... » read more

Blog Review: Feb. 28


Synopsys' Emilie Viasnoff suggests that employing virtual sensors when developing an autonomous driving system helps aid in sensor design and minimizes the hazards associated with extensive real-world driving. Cadence's Anthony Ducimo introduces a methodology for embedded BootROM verification that relies only on standard RTL verification toolchains to reveal bugs, identify unused sections of... » read more

Integrating Digital Twins In Semiconductor Operations


By Mark da Silva, Nishita Rao and Karim Somani Chipmakers must adopt transformative technologies including Digital Twins (DT) to keep pace with unprecedented global semiconductor industry growth that is expected to drive its total market value to $1 trillion[1] as soon as 2030. Leveraging predictive modeling and other efficiency-enhancing innovations, DTs promise to optimize semiconductor d... » read more

Blog Review: Feb. 21


Siemens' John McMillan digs into physical verification maturity for high-density advanced packaging (HDAP) designs and major differences in the LVS verification flow compared to the well-established process for SoCs. Synopsys' Varun Shah identifies why a cloud adoption framework is key to getting the most out of deploying EDA tools in the cloud, including by ensuring that different types of ... » read more

Blog Review: Feb. 14


Siemens’ Dilan Heredia and Karen Chow explain why fast, accurate parasitic extraction (PEX) is essential to design success, especially for the 3 nm node and GAAFETs. Synopsys’ Srinivas Velivala debunks the myth that layout-versus-schematic (LVS) checking is a static step in the chip development process, and details its evolving role in modern SoCs. Cadence’s Mark Seymour digs into a... » read more

Chip Industry Technical Paper Roundup: Feb. 13


New technical papers added to Semiconductor Engineering’s library this week. [table id=197 /] More ReadingTechnical Paper Library home » read more

Chip Ecosystem Apprenticeships Help Close The Talent Gap


Competency-based apprenticeship programs are gaining wider acceptance across the chip industry as companies and governments look for new ways to address talent shortages, and as workers look for new skills that can span multiple industry sectors and industries. Funded in part by the CHIPS Act in the U.S. the European Chips Act, and various other nation-specific and regional programs, apprent... » read more

Heterogeneous Integration And Electronics Packaging Manufacturing Roadmap (SEMI & UCLA)


A report titled “Manufacturing Roadmap for Heterogeneous Integration and Electronics Packaging (MRHIEP)” was published by researchers at SEMI and the University of California Los Angeles (UCLA)'s Center for Heterogeneous Integration and Performance Scaling (CHIPS), and funded by the National Institute of Standards and Technology (NIST). MRHIEP Goals: "The goal of MRHIEP is to develop an o... » read more

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