Formal’s Roadmap


Formal verification has come a long way in the past five years as it focused on narrow tasks within the verification flow. Semiconductor Engineering sat down to discuss that progress, and the future of formal technologies, with [getperson id="11306" comment="Raik Brinkmann"], president and CEO of [getentity id="22395" e_name="OneSpin Solutions"]; Harry Foster, chief verification scientist at [g... » read more

Testing the Big Bang of Smart Devices


Thanks to the proliferation of smart devices in the Internet of Things (IoT), it’s a circumstance not unlike the overwhelming sense of wonder and bewilderment that ancient Greek astronomer Ptolemy must have felt when gazing up at a sky full of stars on a clear winter’s night, trying to rationalize the vast tableau before him. But just as we wouldn’t critique early astronomers and philo... » read more

Transforming Testing Through Automation


"Test your code as you write it.” That’s a common mantra heard in many development teams today. However, for too many, that practice remains a lofty goal as opposed to a business reality. They lack the appropriate metrics and processes to make and measure progress and often underestimate the effort required to manage the cultural change. In this paper you will learn how Coverity: Red... » read more

Moving Automotive Test Into The Analog Domain


The amount of electronic content in passenger cars continues to grow rapidly, driven mainly by the integration of various advanced safety features. The industry’s move towards fully autonomous vehicles promises to even further increase the number of these safety features and consequentially, the electronic content required in each vehicle. Recent reports indicate that hundreds of semicondu... » read more

Analog Fault Simulation Challenges And Solutions


The test time for digital circuit blocks in ICs has greatly decreased in the last 20 years, thanks to scan-based design-for-test (DFT), automatic test pattern generation (ATPG) tools, and scan compression. These technologies have greatly reduced the number of test vectors applied by automatic test equipment (ATE) while maximizing the coverage of a wide range of defect types. But for analog c... » read more

Accelerate Time To Market With Change Impact Testing


QA teams don’t have time to test everything yet they can’t afford to ship buggy code. Teams waste precious resources on tests that have no relevance to the changes that were made to the application. And worse, there may be holes in the testing coverage which could lead to regression risk. Learn how Coverity can help organizations shrink their testing cycles and reduce regression risk by foc... » read more

Putting Design Back Into DFT


Test always has been a delicate balance between cost and quality, but there are several changes happening in the industry that might cause a significant alteration in strategy. Part one of this two part series about [getkc id="47" comment="Design for Test (DFT)"] looked at changes in areas such as automotive, where built in self-test is becoming a mandated part of the design process. This co... » read more

Bridging The Gap Between RF Front-End Module Characterization And Production Test With The Semiconductor Test System


he rapid evolution of wireless connectivity has driven continual consumer thirst for more data throughput and reduced time to market. These pressures have led to modern signaling standards such as 802.11ac and LTE-Advanced, which have placed even more challenging design and test requirements on the most nonlinear and energy-demanding component in the transmitter, the RF power amplifier. The ind... » read more

Connected Reliability Concerns


Ever since the invention of the integrated circuit, the focus has been on improving technology—making it faster, smaller, cheaper, while also cutting the power budget. With the advent of the IoT and ubiquitous connectivity, the value proposition will change. Rather than just improving the chip, the focus will shift to how that chip behaves in context. How does it work in a connected world... » read more

Gaps Emerge In Test Flows


Gaps are showing up in test flows as chipmakers add more analog content and push into more safety-critical applications, exposing more points at which designs need to be tested as well as weaknesses in current tools and methodologies. The cornerstone of the [getkc id="76" kc_name="IoT"], and connected devices such as self-driving cars, is a heavy reliance on [getkc id="187" kc_name="sensors"... » read more

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