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KLA

 

The LS-SWIFT Division of KLA’s Global Products Group provides patterned wafer inspection systems for high-volume semiconductor manufacturing.  Its mission is to deliver market-leading cost of ownership in defect detection for a broad range of applications in the production of semiconductors. Customers from the foundry, logic, memory, automotive, MEMS, advanced packaging and other markets rely upon high-sample wafer inspection information generated by LS-SWIFT products.

 

LS (Laser Scanning) systems enable cost-effective patterned wafer defect detection for the industry’s most sophisticated process technologies deployed in leading-edge foundry, logic, DRAM, and NAND fabs.  SWIFT (Simultaneous Wafer Inspection at Fast Throughput) systems deliver all-wafer-surface (frontside, backside, and edge) macro inspection that is critical for automotive IC, MEMS, and advanced packaging processes as well as foundry/logic and memory fabs.

 

LS-SWIFT operates from a global footprint that includes the US, Singapore, India and Germany, and serves a worldwide customer base across Asia, Europe and North America.

 

Responsibilities

 

Technical:

Responsible for software development activities using Java and C++/C#
Good debugging skills in a complex software setup involving multi-process/multiple systems in Windows/Java environment with good OS concepts
Good with SW design skills/architecture
Understanding of how application works under Windows
Optional skills: Knowledge working with HPC, Linux,
Acquire and demonstrate technical knowledge of inspector software Participate in end to end product development lifecycle activities Acquire knowledge of key use cases in defect inspection using SWIFT tools

and more …

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