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Develop the next generation of algorithms and techniques for semiconductor device and thin film metrology. The position requires a proven innovative track record in the related fields of algorithm development, statistical data analysis, signal processing and electromagnetic modeling. The candidate should have a background in engineering/math/physics and be comfortable and conversant in a range of disciplines from optics, information and noise analysis, solving optimization problems (forward and inverse).

The Research Scientist will produce mathematical formulations, develop modeling tools, and perform data analysis and capability predictions on a variety of metrology technologies. The role will closely interface with other members of Advanced Development, Engineering, Algorithm and Application teams. The candidate should demonstrate ability to develop complex data analysis algorithms, software codes that can be used by others, understanding of experimental data analysis, and ability to guide others.

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