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KLA

The candidate will perform research to design and implement algorithms in two major areas. The first is anomaly detection to flag defects in patterned semiconductor wafers inspected by KLA’s optical and electron beam microscopy tools. The second area is developing efficient solvers for electromagnetics in large structured dielectric media corresponding to various inspection targets. The candidate must be proficient in developing scientific computing codes for distributed and shared memory systems. The ideal candidate would have 5+ years of experience beyond graduation.

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