The Film and Scatterometry Technology (FaST) Division provides industry leading metrology solutions for worldwide semiconductor IC manufacturers.  The FaST Division portfolio of metrology products includes hardware and software solutions for optical film thickness, optical critical dimension (CD), composition, and resistivity measurement systems.  These products are essential for the IC manufacturers as they provide critical metrology capabilities for the development and implementation of their advanced IC processes.  The FaST division is committed to support our customers to achieve performance entitlement of our solution and we effectively partner with our customers from their early research and development phase to the high volume in-line manufacturing implementation specific for their process needs.  The division consists of a global team located in US, Israel, China, and India.

Experience with soft X-ray systems, vacuum systems, X-ray optics and detectors
Experience in troubleshooting X-ray beam lines is a plus
Must have a strong background in engineering or the physical sciences and demonstrated analysis and problem solving skills.
Must have a good understanding of Optical, Electromechanical and Software systems and their interactions in the context of complex industrial equipment.
Should be familiar with scientific and statistical analysis tools and SW tools such as Matlab, LabView, Python.
Experience in developing a subsystem in one or more of the above areas are highly desirable.
Knowledge of semiconductor manufacturing processes and image analysis is desirable.
Should have the ability to influence functional groups to drive system level decisions.
Knowledge of IP development (desired).

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