With over 40 years of semiconductor process control experience, chipmakers around the globe rely on KLA to ensure that their fabs ramp next-generation devices to volume production quickly and cost-effectively. Enabling the movement towards advanced chip design, KLA’s Global Products Group (GPG), which is responsible for creating all of KLA’s metrology and inspection products, is looking for the best and the brightest research scientist, software engineers, application development engineers, and senior product technology process engineers.

The Film and Scatterometry Technology (FaST) Division provides industry leading metrology solutions for worldwide semiconductor IC manufacturers.  The FaST Division portfolio of metrology products includes hardware and software solutions for optical film thickness, optical critical dimension (CD), composition, and resistivity measurement systems.  These products are essential for the IC manufacturers as they provide critical metrology capabilities for the development and implementation of their advanced IC processes.  The FaST division is committed to support our customers to achieve performance entitlement of our solution and we effectively partner with our customers from their early research and development phase to the high volume in-line manufacturing implementation specific for their process needs.  The division consists of a global team located in US, Israel, China, and India.


Develop the next generation of algorithms and techniques for semiconductor device and thin film metrology. The position requires a proven innovative track record in the related fields of algorithm development, statistical data analysis, signal processing and electromagnetic modeling. The candidate should have a background in engineering/math/physics and be comfortable and conversant in a range of disciplines from optics, information and noise analysis, solving optimization problems (forward and inverse).

The Research Scientist will produce mathematical formulations, develop modeling tools, and perform data analysis and capability predictions on a variety of metrology technologies. The role will closely interface with other members of Advanced Development, Engineering, Algorithm and Application teams. The candidate should demonstrate ability to develop complex data analysis algorithms, software codes that can be used by others, understanding of experimental data analysis, and ability to guide others.

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