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Lam Research

Responsible for managing and executing pattern wafer defect inspection, review, metrology and analysis projects using state of the art 300mm assets in order to provide differentiated process technology solutions in terms of yield, on wafer performance and productivity.

Develop new defectivity solutions and collaborate with process technologists at the highest technical levels in order to deliver high information content results in support of key product development and customer support projects.

Collaborate with business units in order to leverage extensive amount of defectivity data by means of developing Deep Learning techniques in order to identify high value patterns and to extract mechanistic knowledge and root-causes of failures.

When fully integrated, make recommendations and develop solutions that enhance Lam’s overall metrology and defect inspection and review capabilities that reduce time to solution.

Perform regular evaluation of key metrology assets using SPC methods to ensure that toolsets in your area are operating at optimum performance levels.
Minimum Qualification
Typically requires  a Master’s degree with 4 years of relevant experience or a PhD degree with 1 year of experience. Preferred fields are; Physics, Materials Science, Chemistry,  EE, ChE, ME or a related field
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