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Lam Research

FIB-STEM Electron Microscopist
Primary function is processing/imaging STEM samples using FEI 4xx/Helios Dual Beam FIB tools, and TEM sample preparation

Set up, operate, and troubleshoot metrology equipment
Actively participate on developing new technique to expedite sample processing
Provide new learnings and developments to other team members through documentation, presentations, and training sessions
Collaborate with process engineers
Work with process engineers to understand how to best process their samples using metrology equipment
Participate in evaluating new instruments for lab growth
For additional details and most recent updates, hit “Apply for job”