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Lam Research

Job Responsibilities
Responsible for managing and executing defect inspection, review and chemical analysis projects using state of the art 300mm metrology assets in order to provide differentiated process technology solutions for optimum yield, on wafer performance and productivity.
Develop new pattern and blanket wafer defectivity inspection/review and metrology solutions and collaborate with process technologists in order to deliver high information content results in support of key product development and other business critical projects.
Leverage relevant Deep Learning techniques to analyze large amounts of data in order to identify high value trends and to extract mechanistic knowledge and root-causes of failures.
Develop metrology calibrated defectivity models to enable realistic defect simulations in collaboration with process and simulation teams. Implement Failure Analysis (FA) process flows to help discover defect formation root-causes.
When fully integrated, make recommendations and develop solutions that enhance Lam’s overall metrology and  defect inspection and review capabilities to reduce time to solution.
Implement and perform SPC methods for regular evaluation of key metrology assets to ensure that toolsets in your area are operating at optimum performance levels.
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