Maxim Integrated

Performing yield enhancement on a variety of pmic, analog, and mixed signal products; defining problems by identifying failure modes and impacted materials with statistical data analysis; performing laboratory electrical verification and validation on the failing integrated chips; performing circuit debugging and root cause analysis by using CADENCE, Labview, fib editing, and other electronic equipment (parametric analyzer, oscilloscope, etc.) and fault isolation equipment (electron microscopy, obirch optical beam induced resistance change, etc.); driving solutions across organizations.

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