Lam Research

This is an exciting opportunity to start a career in Semi-Conductor industry as a Metrology Applications Engineer.  Job focus: Full wafer Scanning Electron Microscope (SEM) metrology tools for Defect Review and/or CDSEM measurements with opportunities to expand in other areas of metrology as your career progresses.

Successful candidates will be trained in metrology tool applications for the following techniques: Full wafer Scanning Electron Microscope (SEM) imaging for Defect Review, Electron Dispersive X-Ray Spectroscopy (EDS/EDX) for defect elemental analysis, Critical Dimension Scanning Electron Microscope (CD-SEM) measurement and analysis, Statistical Process Control (SPC) for tool monitoring, Coupon sample mounting and SEM imaging using pocket carrier wafers, Data analysis, and Reporting generation.

 

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