中文 English

Onto Innovation

The position reports to the Applications Manager and will be based in Boise ID. Reporting to the Applications ManagerThe new hire will have the opportunity to work closely with process engineers in semiconductor fabs to develop metrology solutions for complex multi-layer, optical critical dimension (scatterometry), and overlay measurements for state-of-the-art logic and memories devices. Duties will include applications development and characterization of cutting-edge measurement technologies, creating technology/product presentations, and providing technical training for customers.

For additional details and most recent updates, hit “Apply for job”