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Fraunhofer-Institut für Integrierte Schaltungen IIS, Institutsteil Entwicklung Adaptiver Systeme EAS, Dresden, Deutschland

June 2022

Webinar: IC Reliability – an Overview (Online)

Our IC reliability webinar provides an overview of measurements and simulations to ensure IC reliability, especially for long life applications. In particular, we highlight the technology qualification process based on wafer-level reliability measurements to degradation models that can be used in ageing simulations to virtually investigate the reliability of a design before manufacturing.

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