Built-in self-test (BiST)

Built-in self-test, or BIST, is a structural test method that adds logic to an IC which allows the IC to periodically test its own operation. Two major types are memory BIST and logic BIST. Memory BIST, or MBIST, generates patterns to the memory and reads them to log any defects. Memory BIST also consists of … Continue reading Built-in self-test (BiST)