Top Stories

Test Costs Spiking
Use of more complex chips in safety- and mission-critical markets is changing pricing formulas for manufacturing.

Taming Novel NVM Non-Determinism
The race is on to find an easier-to-use alternative to flash that is also non-volatile.

Grading Chips For Longer Lifetimes
Different use cases, dependencies and testability are making direct comparisons much more difficult.

Blogs

Editor In Chief Ed Sperling argues that just putting a chip on an ATE machine is no longer sufficient for many applications, in Test Is Becoming A Horizontal Process.

KLA’s Meng Zhu, Roman Sappey, and Jeff Barnum ask what MRAM is and why it is becoming more attractive to the industry, in MRAM Process Development And Production Briefing.

Mentor’s Mohammed Abdelwahid examines an improvement to BiST that meets test coverage for ISO 26262, in Improving Functional Safety For ICs.

YieldHub’s Marie Ryan digs into how using wafer acceptance testing to monitor the consistency of key parameters across a wafer can improve yield and reduce defects, in What’s WAT? Testing At The End Of Manufacturing.

OptimalPlus’ Michael Schuldenfrei explains how using a communication framework that tracks an asset’s data throughout its lifecycle can be used to integrate traditionally siloed data into business operations, In Manufacturing Optimization With Digital Thread.

FormFactor’s Amy Leong describes why making chiplets a mainstream technology relies on balancing the cost of test with yield risk, in Wafer Test Challenges For Chiplets.