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Test, Measurement & Analytics

Top Stories

New Memories Add New Faults
Why existing test approaches don't always work, and what still needs to be done to ensure reliability.
Published on September 7th,  2021 by Bryon Moyer

Fabs Drive Deeper Into Machine Learning
Wafer image interpretation can impact yield and throughput.
Published on September 7th,  2021 by Anne Meixner

Making Test Transparent With Better Data
How the new test data standard can make the test floor more accessible in real-time.
Published on September 7th,  2021 by Susan Rambo

Designing Chips For Test Data
Getting the data out is only part of the problem. Making sure it's right is another challenge altogether.
Published on August 10th,  2021 by Ed Sperling

Why Wafer Bumps Are Suddenly So Important
As density increases, so does the risk of chip failures.
Published on August 10th,  2021 by Anne Meixner

Who Owns In-Chip Monitoring Data?
Rules are still being formulated even though the technology is already deployed.
Published on August 10th,  2021 by Bryon Moyer

Geo-Spatial Outlier Detection
Using position to find defects on wafers.
Published on July 19th,  2021 by Anne Meixner

5G Chips Add Test Challenges
Commercial solutions will take time to ramp, but progress is being made.
Published on July 6th,  2021 by Bryon Moyer

Cleaning Up During IC Test
Dirty probe tips and sockets adversely affect test, which can impact chip reliability.
Published on July 6th,  2021 by Anne Meixner

IC Data Hot Potato: Who Owns And Manages It?
Dealing with a deluge of data in IC inspection, metrology, and test.
Published on July 6th,  2021 by Susan Rambo And Ed Sperling

More Top Stories »



Round Tables

Predicting And Avoiding Failures In Automotive Chips
Experts at the Table: New approaches rely on more and better data, but it also requires sharing of data across the supply chain.
Published on March 2nd,  2021 by Ed Sperling

Chips Good Enough To Bet Your Life On
Experts at the Table: Strategies for improving automotive semiconductors.
Published on November 10th,  2020 by Ed Sperling

Dealing With Two Very Different Sides Of 5G
Experts at the Table: One side is well-behaved and predictable, the other is not. How to ensure reliability across both is a looming challenge.
Published on November 9th,  2020 by Ed Sperling

New 5G Hurdles
Experts at the Table, part 2: Getting 5G standards and technology ready are only part of the problem. Reducing latency and developing applications ...
Published on August 1st,  2018 by Ed Sperling

Preparing For A 5G World
Experts at the table, part 1: Rising costs, massive complexity, and challenges in testing and simulating these devices will require some fundamenta...
Published on July 12th,  2018 by Ed Sperling

More Roundtables »



Multimedia

Design For Test Data
Creating chips that can be tested throughout their expected lifetimes.
Published on July 14th,  2021 by Ed Sperling

Monitoring Performance From Inside A Chip
Why it's essential to track potential faults throughout a chip's lifetime.
Published on June 1st,  2021 by Ed Sperling

Silicon Lifecycle Management
Mapping, tracking and reacting to changes throughout a chip’s expected lifetime.
Published on November 30th,  2020 by Ed Sperling

Using ML In Manufacturing
Applying machine learning to different use cases to limit early life failures.
Published on June 23rd,  2020 by Ed Sperling

Ensuring HBM Reliability
What can go wrong and how to find it.
Published on May 27th,  2020 by Ed Sperling

More Multimedia »



See All Posts in Test Measurement and Analytics »

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