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Test, Measurement & Analytics

Top Stories

Reliability Costs Becoming Harder To Track

Test, metrology and inspection costs blur as the number of options increase and chips are developed for specific applications.

Is There a Practical Test For Rowhammer Vulnerability?

New approaches surface for persistent DRAM issue.

Digging Much Deeper With Unit Retest

It's no longer just an automatic retest to improve yield. Rising product complexity, pressures on manufacturing costs, and better data are making t...

Managing Wafer Retest

Dealing with multiple wafer touchdowns requires data analytics and mechanical engineering finesse.

Chip Monitoring And Test Collaborate

What's driving tighter interaction between processes, and what's next.

Testing Analog Circuits Becoming More Difficult

Mixed signal content at advanced nodes and in packages is prompting alternative approaches.

Chasing Test Escapes In IC Manufacturing

Data analytics can greatly improve reliability, but cost tradeoffs are complicated.

AI In Inspection, Metrology, And Test

AI systems are making inroads into IC manufacturing and assembly, but it's slow going — on purpose.

Sharing Secure Chip Data For Analytics

Security practices are evolving to meet sharing data across siloed engineering teams, but they still have a long way to go.

Monitoring Chips On Many Levels

Understanding chip behavior, performance, and aging from the inside.

More Top Stories »



Round Tables

Predicting And Avoiding Failures In Automotive Chips

Experts at the Table: New approaches rely on more and better data, but it also requires sharing of data across the supply chain.

Chips Good Enough To Bet Your Life On

Experts at the Table: Strategies for improving automotive semiconductors.

Dealing With Two Very Different Sides Of 5G

Experts at the Table: One side is well-behaved and predictable, the other is not. How to ensure reliability across both is a looming challenge.

New 5G Hurdles

Experts at the Table, part 2: Getting 5G standards and technology ready are only part of the problem. Reducing latency and developing applications ...

Preparing For A 5G World

Experts at the table, part 1: Rising costs, massive complexity, and challenges in testing and simulating these devices will require some fundamenta...

More Roundtables »



Multimedia

Monitoring Performance From Inside A Chip

Why it's essential to track potential faults throughout a chip's lifetime.

Silicon Lifecycle Management

Mapping, tracking and reacting to changes throughout a chip’s expected lifetime.

Using ML In Manufacturing

Applying machine learning to different use cases to limit early life failures.

Ensuring HBM Reliability

What can go wrong and how to find it.

Cleaning Data For Final Test

How the quality of data can affect time to yield.

More Multimedia »



See All Posts in Test Measurement and Analytics »

Latest Blogs

Editor's Note

3 Technologies That Will Challenge Test

It's not entirely clear what those tests are supposed to do, but they could h...
June 8, 2021
Intelligent Innovation

Expanded Material Metrology For Refined Etch Selectivities

The role of Fourier transform infrared spectroscopy (FTIR) in monitoring BPSG...
Silicon Lifecycle Management

Signal Connectivity Checks Are Not Just For Design-For-Te...

Find issues earlier by validating the connection of clocks and resets.
The Human Machine Interface

Hybrid System-Level Test For RF SiP

Combining conventional ATE and system-level test for OTA test of Bluetooth Lo...
Test Insight From Lab To Fab

Cryostats Enable Astrophysics Research

Designing a critical part of the eight radio telescopes that make up the Subm...
May 11, 2021
Health & Performance Monitoring

Early And Fine Virtual Binning

Meeting market demand with higher precision at lower costs.
September 8, 2020
Inspecting The Future

Measuring Reflective Surfaces

High reliability requires measurements in multiple directions.
June 15, 2020
Yield Management

MRAM Process Development And Production Briefing

What is MRAM and why is it becoming more attractive to the industry?
March 10, 2020

Knowledge Centers
Entities, people and technologies explored


  Trending Articles

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