Test, Measurement & Analytics

Top Stories

The Growing Challenges Of 5G Reliability

Rapid changes in next-gen wireless technology and standards are only adding to the complexity.

Gaps Emerge In Test And Analytics

Comparison data is required for understanding drift and AI changes, but that's not so simple.

Testing In Context Gaining Ground

Why simple pass/fail testing no longer works.

Different Ways To Improve Chip Reliability

Push toward zero defects requires more and different kinds of test in new places.

Test In New Frontiers: Flexible Circuits

How test is keeping up with technology changes.

Leveraging Data In Chipmaking

PDF Solution's CEO talks about the growing impact of analytics and AI on semiconductor design and manufacturing.

Reducing Costly Flaws In Heterogeneous Designs

Why finding and fixing errors in AI and automotive chips is so difficult.

Shrinking AV’s 1 Billion Test Miles

What makes an autonomous vehicle safe in real-world traffic situations?

Testing Against Changing Standards In Automotive

There is no right answer yet for autonomous vehicles, and that's causing problems.

How Hardware Can Bias AI Data

Degrading sensors and other devices can skew AI data in ways that are difficult to discern.

More Top Stories »

Round Tables

New 5G Hurdles

Experts at the Table, part 2: Getting 5G standards and technology ready are only part of the problem. Reducing latency and developing applications ...

Preparing For A 5G World

Experts at the table, part 1: Rising costs, massive complexity, and challenges in testing and simulating these devices will require some fundamenta...

More Roundtables »


How To Ensure Reliability

Using holistic product quality as a metric for determine how a device will function over its lifetime.

Using Machine Learning To Break Down Silos

Different ways to use ML in semiconductor manufacturing.

How 5G Affects Test

How to ensure millimeter wave technology will be reliable enough.

Changes In Data Storage and Usage

Managing data lakes, silos, and different data types.

New Challenges In Testing 5G Devices

Complex hurdles in characterizing performance and optimizing signals.

More Multimedia »

See All Posts in Test Measurement and Analytics »

Latest Blogs

Editor's Note

Reliability At 5nm And Below

What's really holding back improvements in design and manufacturing.
December 10, 2019
Test For The Autonomous Age

Squeezing Out More Test Compression

Reclaim lost profit margin with hybrid ATPG/LBIST test points.
Inside Big Data

Reducing Automotive Failure Rates With QPaaS

The increasing semiconductor content in today's vehicles heightens their vuln...
Semiconductor Yield Management

A Holistic Approach To Yield Management

Key advantages of using a yield management system include better communicatio...
Scaling Electronics

Improving Reliability Monitoring Of High-Bandwidth Memory

How deep data analytics enable in-field HBM monitoring and repair.
Accelerating Design & Test

Should We Even Be Talking About 6G?

It's exciting to look ahead to the next big thing, but there's still a lot le...
November 12, 2019
Extraordinary ASICs

Deprocessing And SEM For Semiconductor Failure Analysis

Finding failure sites that are hidden from optical view.
July 9, 2019
Yield Management

Digging Deep Into High Aspect Ratio Process Control For M...

3D NAND has led to complex deposition and etch with angstrom-level precision ...
October 18, 2018

Knowledge Centers
Entities, people and technologies explored

  Trending Articles

Power Complexity On The Rise

New architectures, different markets and more variables make it increasingly difficult to design and verify low-power chips.

November 2019 Startup Funding

Sixteen startups attracted funding rounds of nine figures in November.

Using FPGAs For AI

How good are standard FPGAs for AI purposes, and how different will dedicated FPGA-based devices be from them?

DRAM Scaling Challenges Grow

More nodes and alternative memories are in the works, but schedules remain murky.

Multi-Patterning EUV Vs. High-NA EUV

Next-gen litho is important for scaling, but it’s also expensive and potentially risky.