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Test, Measurement & Analytics

Top Stories

Removing Barriers For End-To-End Analytics

What's needed to effectively share data across the supply chain.

The Race To Zero Defects In Auto ICs

100% inspection, more data, and traceability will reduce assembly defects plaguing automotive customer returns.

Bridging IC Design, Manufacturing, And In-Field Reliability

What goes wrong in complex chips, what can be done to fix them, and how to avoid issues in the future.

Hidden Impacts Of Software Updates

Over-the-air code changes can stress systems in unexpected ways.

Where And When End-to-End Analytics Works

Improving yield, reliability, and cost by leveraging more data.

How AI/ML Improves Fab Operations

Smart chip manufacturing is now a requirement, and it requires rethinking processes that have been in place for decades.

Lots Of Data, But Uncertainty About What To Do With It

Sensors are being added everywhere to monitor everything from aging effects to PVT, yet the industry is struggling to figure out the best ways to e...

Strategies For Faster Yield Ramps On 5nm Chips

Smart software finds more EUV stochastic defects and missing vias, improving wafer yield.

Finding And Applying Domain Expertise In IC Analytics

It takes a team of experts to set up and effectively use analytics.

Silicon Lifecycle Management’s Growing Impact On IC...

SLM is being integrated into chip design as a way of improving reliability in heterogeneous chips and complex system.

More Top Stories »



Round Tables

Bridging IC Design, Manufacturing, And In-Field Reliability

What goes wrong in complex chips, what can be done to fix them, and how to avoid issues in the future.

Lots Of Data, But Uncertainty About What To Do With It

Sensors are being added everywhere to monitor everything from aging effects to PVT, yet the industry is struggling to figure out the best ways to e...

Silicon Lifecycle Management’s Growing Impact On IC...

SLM is being integrated into chip design as a way of improving reliability in heterogeneous chips and complex system.

Predicting And Avoiding Failures In Automotive Chips

Experts at the Table: New approaches rely on more and better data, but it also requires sharing of data across the supply chain.

Chips Good Enough To Bet Your Life On

Experts at the Table: Strategies for improving automotive semiconductors.

More Roundtables »



Multimedia

Deep Learning In Industrial Inspection

Using deep learning to find defects.

Total Critical Area For Optimizing Test Patterns

Using data to target areas on a chip where defects are most likely to occur.

Growing Challenges With Wafer Bump Inspection

Co-planarity, variation and data collection emerge as top issues.

Optimizing AI Systems

What goes wrong, and what to do about it.

Design For Test Data

Creating chips that can be tested throughout their expected lifetimes.

More Multimedia »



See All Posts in Test Measurement and Analytics »

Latest Blogs

Yield Management

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Higher resolution, brightness, and refresh rate for both tiny and very large ...
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Center Stage: The Time For Hybrid Bonding Has Arrived

Hybrid bonding relies on high-precision defect inspection, planarity measurem...
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Silicon Lifecycle Management

Enabling SoC Visibility For Future Secure Hardware Archit...

Tracking temperature and voltage changes in the Morello project SoC.
The Human Machine Interface

Trends In Testing: New Challenges Create New Opportunities

Test flows that happen throughout the lifecycle of the device need to be flex...
Next-Generation Test

Semiconductor Test: Staying Ahead Of Nanodevices

The growing demand for scan and the need for new DFT approaches as individual...
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Cybersecurity Through Hardware-Based Threat Detection And...

Traditional software-only security measures aren't enough to meet emerging se...
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Health & Performance Monitoring

Assuring Reliable Processor Performance At Scale

Use data to manage data center infrastructure.
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Editor's Note

The Importance Of Layering Data

There is plenty of data being generated, but not enough people have access to...
January 11, 2022
Inspecting The Future

Deep Learning Delivers Fast, Accurate Solutions For Objec...

Overcoming variability in the appearance of corner fill.
December 7, 2021

Knowledge Centers
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