Test, Measurement & Analytics

Top Stories

More Semiconductor Data Moving To Cloud

A year ago many companies were unwilling to ship their data offsite. What changed?

How Many Test Miles Make A Vehicle Safe?

Simulation and test can improve safety, but that requires a standard framework and definitions.

Using Better Data To Shorten Test Time

More sensors plus machine learning are making it possible to focus testing where it has the most impact.

Silicon Photonics Begins To Make Inroads

Maturing processes and new application areas open doors for extremely fast, low-power applications.

Big Shifts In Big Data

Why the growth of cloud and edge computing and the processing of more data will have a profound effect on semiconductor design and manufacturing.

5G OTA Test Not Ready For Production

High-volume, production-ready over-the-air testing systems don’t yet exist for 5G.

Data Confusion At The Edge

Disparities in processors and data types will have an unpredictable impact on AI systems.

Inspection, Metrology Challenges Grow For SiC

Defects, scale remain problematic, but new tools may help.

5G Drives New Test Approaches

Lots of scans and testbeds, but not enough automation.

Challenges In Making And Testing STT-MRAM

Next-gen memory offers speed of SRAM and unlimited endurance, but it's not a simple technology to work with.

More Top Stories »

Round Tables

New 5G Hurdles

Experts at the Table, part 2: Getting 5G standards and technology ready are only part of the problem. Reducing latency and developing applications ...

Preparing For A 5G World

Experts at the table, part 1: Rising costs, massive complexity, and challenges in testing and simulating these devices will require some fundamenta...

More Roundtables »


Using ML For Post-Silicon Validation

Why machine learning is so effective in improving chip designs.

ATE Lab To Fab

How to close the gap between the design and test worlds to improve coverage and shorten time to market.

Making AI More Dependable

Considerations in using AI to improve reliability in all chips.

Concurrent Test

The growing challenge to do more in the same time window.

AI In Chip Manufacturing

How AI with knowledge transfer can significantly decrease error rates and improve test.

More Multimedia »

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Latest Blogs

Editor's Note

The Great Test Blur

Why test may become the next bottleneck in design.
August 6, 2019
Inside Big Data

5 Steps To Data-Driven Manufacturing

A checklist for using data more effectively.
Scaling Electronics

Degradation Monitoring – From Vision to Reality

How to use in-circuit monitoring and off-chip machine-learning to improve rel...
Test For The Autonomous Age

Hierarchical DFT On A Flat Layout Design

If you need to perform full-flat physical implementation, can you still take ...
Semiconductor Yield Management

Who Is Responsible For Part Average Testing?

While OSATs have historically performed outlier detection, more fabless compa...
Extraordinary ASICs

Deprocessing And SEM For Semiconductor Failure Analysis

Finding failure sites that are hidden from optical view.
July 9, 2019
Accelerating Design & Test

Highlights From The Automotive Testing Expo 2019

Active safety, vehicle electrification, and connectivity were big draws at th...

Knowledge Centers
Entities, people and technologies explored

  Trending Articles

Why Scaling Must Continue

But calling this an extension of Moore’s Law is a mistake.

Power Is Limiting Machine Learning Deployments

Rollouts are constrained by the amount of power consumed, and that may get worse before it gets better.

HBM2E: The E Stands for Evolutionary

The new version of the high bandwidth memory standard promises greater speeds and feeds and that’s about it.

The Next New Memories

A new crop of memories in R&D could have a big impact on future compute architectures.

Week In Review: Manufacturing, Test

Apple buys Intel’s phone modem biz; Optimal+ adds ML analytics; Q2 numbers; Japan-Korea trade war.