Test, Measurement & Analytics

Top Stories

Inspection, Metrology Challenges Grow For SiC

Defects, scale remain problematic, but new tools may help.

5G Drives New Test Approaches

Lots of scans and testbeds, but not enough automation.

Challenges In Making And Testing STT-MRAM

Next-gen memory offers speed of SRAM and unlimited endurance, but it's not a simple technology to work with.

5G Heats Up Base Stations

Inefficient conversion of RF to digital and continuous connectivity issues are causing thermal problems, threatening signal integrity and reliability.

Gaps Emerge In Automotive Test

Reliability requires different parts to work in sync, and much more time-consuming testing and simulation.

Racing To The Edge

The opportunity is daunting, but so are the challenges for making all the pieces work together.

New Approaches To Security

Data analytics, traffic patterns and restrictive policies emerge as ways to ensure that systems are secure.

3D NAND Metrology Challenges Growing

Rising costs and gaps in equipment emerge as technology scales; new tools under development.

Gaps In 5G Test

Millimeter wave technology will require a whole new approach to ensuring reliability.

Finding Defects In Chips With Machine Learning

Better algorithms and more data could bolster adoption, particularly at advanced nodes.

More Top Stories »

Round Tables

New 5G Hurdles

Experts at the Table, part 2: Getting 5G standards and technology ready are only part of the problem. Reducing latency and developing applications ...

Preparing For A 5G World

Experts at the table, part 1: Rising costs, massive complexity, and challenges in testing and simulating these devices will require some fundamenta...

More Roundtables »


Using ML For Post-Silicon Validation

Why machine learning is so effective in improving chip designs.

ATE Lab To Fab

How to close the gap between the design and test worlds to improve coverage and shorten time to market.

Making AI More Dependable

Considerations in using AI to improve reliability in all chips.

Concurrent Test

The growing challenge to do more in the same time window.

AI In Chip Manufacturing

How AI with knowledge transfer can significantly decrease error rates and improve test.

More Multimedia »

See All Posts in Test Measurement and Analytics »

Latest Blogs

Inside Big Data

Thinking Differently About IIoT Analytics

How to make machines more efficient and reliable.
June 17, 2019
Editor's Note

Test Moving Forward And Backward

What used to be a discrete step in the flow is becoming less well-defined and...
June 11, 2019
Test For The Autonomous Age

Smart Plug-And-Play DFT For Arm Cores

A new RTL-based hierarchical DFT flow for subsystems with Arm cores promises ...
Extraordinary ASICs

Failure Analysis Of Electronic Devices Using Scanning Aco...

Why non-destructive SAM is an efficient tool for analysis of adhesion between...
Accelerating Design & Test

Modernizing Test In Aerospace And Defense

Test systems must evolve to keep pace with advancements in technology while s...
May 7, 2019

Knowledge Centers
Entities, people and technologies explored

  Trending Articles

5nm Vs. 3nm

Half nodes, different transistor types, and numerous other options are adding uncertainty everywhere.

Sidestepping Moore’s Law

Why multi-die solutions are getting so much attention these days.

MicroLEDs: The Next Revolution In Displays?

Technology offers improved brightness, colors, and lower power, but they’re expensive and difficult to manufacture.

What’s Next In Advanced Packaging

Wave of new options under development as scaling runs out of steam.

Machine Learning Drives High-Level Synthesis Boom

As endpoint architectures get more complicated, EDA tool becomes key tool for experimenting with different options.