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Test, Measurement & Analytics

Top Stories

New Memories Add New Faults

Why existing test approaches don't always work, and what still needs to be done to ensure reliability.

Fabs Drive Deeper Into Machine Learning

Wafer image interpretation can impact yield and throughput.

Making Test Transparent With Better Data

How the new test data standard can make the test floor more accessible in real-time.

Designing Chips For Test Data

Getting the data out is only part of the problem. Making sure it's right is another challenge altogether.

Why Wafer Bumps Are Suddenly So Important

As density increases, so does the risk of chip failures.

Who Owns In-Chip Monitoring Data?

Rules are still being formulated even though the technology is already deployed.

Geo-Spatial Outlier Detection

Using position to find defects on wafers.

5G Chips Add Test Challenges

Commercial solutions will take time to ramp, but progress is being made.

Cleaning Up During IC Test

Dirty probe tips and sockets adversely affect test, which can impact chip reliability.

IC Data Hot Potato: Who Owns And Manages It?

Dealing with a deluge of data in IC inspection, metrology, and test.

More Top Stories »



Round Tables

Predicting And Avoiding Failures In Automotive Chips

Experts at the Table: New approaches rely on more and better data, but it also requires sharing of data across the supply chain.

Chips Good Enough To Bet Your Life On

Experts at the Table: Strategies for improving automotive semiconductors.

Dealing With Two Very Different Sides Of 5G

Experts at the Table: One side is well-behaved and predictable, the other is not. How to ensure reliability across both is a looming challenge.

New 5G Hurdles

Experts at the Table, part 2: Getting 5G standards and technology ready are only part of the problem. Reducing latency and developing applications ...

Preparing For A 5G World

Experts at the table, part 1: Rising costs, massive complexity, and challenges in testing and simulating these devices will require some fundamenta...

More Roundtables »



Multimedia

Design For Test Data

Creating chips that can be tested throughout their expected lifetimes.

Monitoring Performance From Inside A Chip

Why it's essential to track potential faults throughout a chip's lifetime.

Silicon Lifecycle Management

Mapping, tracking and reacting to changes throughout a chip’s expected lifetime.

Using ML In Manufacturing

Applying machine learning to different use cases to limit early life failures.

Ensuring HBM Reliability

What can go wrong and how to find it.

More Multimedia »



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Latest Blogs

Silicon Lifecycle Management

SLM Is Changing The Complete Device Lifecycle Process

Enabling heightened levels of visibility in device performance, reliability, ...
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Intelligent Innovation

In The Spotlight: What Is Responsible For The Surging Dem...

New fabs for 28nm node production point to a boom in AR/VR devices.
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IC Test & Lifecycle Insights

The Era Of Packetized Scan Test Has Arrived

Bus-based scan data distribution takes the world by storm.
The Human Machine Interface

SLT Enables Test Content To Shift Right

Optimize test efficiency and part quality by transferring some test steps fro...
August 10, 2021
Test Insight From Lab To Fab

Production Testing For Silicon Photonics Wafers

Getting lower power optical transceivers ready for the data center.
Yield Management

Automotive Innovations In Semiconductors

What's changing in vehicles and how that will impact chip inspection, metrolo...
July 15, 2021
Editor's Note

3 Technologies That Will Challenge Test

It's not entirely clear what those tests are supposed to do, but they could h...
June 8, 2021
Health & Performance Monitoring

Early And Fine Virtual Binning

Meeting market demand with higher precision at lower costs.
September 8, 2020
Inspecting The Future

Measuring Reflective Surfaces

High reliability requires measurements in multiple directions.
June 15, 2020

Knowledge Centers
Entities, people and technologies explored


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