Packaging, Test & Electronic Systems

Top Stories

The Rising Value Of Data

Race begins to figure out what else can be done with data. But not all data is useful, and some of it is faulty.

Cheaper Fan-Outs Ahead

Demand for lower cost drives R&D for panel-level packaging. But which size?

Advanced Packaging Moves To Cars

Supply chain shake-up as OEMs look to fan-outs and systems in package for differentiation and faster time to market.

Module Testing Adds New Challenges

Technology is shaping up as system-level functional test.

5G Test Equipment Race Begins

Next-gen wireless communications technology is still under development, but instrument suppliers are ready to test 5G in trial deployments.

Advanced Packaging Picks Up Steam

System-in-package technology is poised to roll out across multiple new markets.

Tracking Down Errors With Data

Optimal Plus' CTO looks at how data can be deployed to improve quality and yield, and to find out what went wrong.

Shrink Or Package?

Advanced packaging shifts to mainstream with complete flows, better tools, market proof points.

Chip Test Shifts Left

Semiconductor testing moves earlier in the process as quality and reliability become increasingly important.

Security Issues Up With Heterogeneity

Supply chain becomes central focus as more processors and memories are added into devices.

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Round Tables

2.5D Surprises And Alternatives

First of two parts: Cost and supply chain issues remain as advanced packaging begins to ramp.

Stacked Die Changes

Experts at the table, part 3: How mature are high-speed interconnects and what hurdles remain for widespread adoption.

Stacked Die Changes

Experts at the table, part 2: Different coefficients of thermal expansion cause warpage problems; known good die issues.

Stacked Die Changes

Experts at the table, part 1: There are new and better options for packaging chips together as the semiconductor industry begins to figure out what...

More Roundtables »


Tech Talk: System In Package

Why advanced packaging is so important for autonomous driving and the semiconductor industry.

Tech Talk: 2.5D Issues

How ready is this packaging approach and what problems remain?

Tech Talk: 14nm And Stacked Die

Why the 14nm node will be long lived, and how it will be used in 2.5D and 3D-IC packages.

Tech Talk: 2.5D Stacked Die

What's the real motivation behind stacking die?

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Latest Blogs

Editor's Note

Packaging Enters New Phase

Effort to trim costs follows market proof points that fan-outs and SiP are worki...
The Connected Perspective

A Tale of Two Testers

New offerings from Advantest and Xcerra are quite different....
Accelerating Design & Test

Women In Engineering

Why mentoring and STEM are so important for the next generation of engineers....
Inside Big Data

Are All Known Good Tested Devices Created Equal?

Post-mortem on RMAs backed by Big Data Analytics prove otherwise. ...

The Future of Testing

System-level testing and other technologies are on deck....
EDA For Manufacturability

Crossing The Chasm: Uniting SoC And Package Verification

EDA companies, OSATs, and foundries must collaborate to ensure wafer-level packa...

Knowledge Centers
Entities, people and technologies explored

  Trending Articles

How Reliable Are FinFETs?

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Machine Learning Popularity Grows

After two decades of experimentation, the semiconductor industry is scrambling to embrace this approach.

The Rising Value Of Data

Race begins to figure out what else can be done with data. But not all data is useful, and some of it is faulty.

CCIX Enables Machine Learning

The mundane aspects of a system can make or break a solution, and interfaces often define what is possible.