Test, Measurement & Analytics

Top Stories

Reducing Costly Flaws In Heterogeneous Designs
Why finding and fixing errors in AI and automotive chips is so difficult.
Published on October 8th,  2019 by Ed Sperling

Shrinking AV’s 1 Billion Test Miles
What makes an autonomous vehicle safe in real-world traffic situations?
Published on October 8th,  2019 by Kevin Fogarty

Testing Against Changing Standards In Automotive
There is no right answer yet for autonomous vehicles, and that's causing problems.
Published on October 8th,  2019 by Ed Sperling and Kevin Fogarty

How Hardware Can Bias AI Data
Degrading sensors and other devices can skew AI data in ways that are difficult to discern.
Published on September 10th,  2019 by Ed Sperling

Test On New Technology’s Frontiers
Where the gaps are and what that means for coverage and reliability.
Published on September 10th,  2019 by Ed Sperling And Susan Rambo

Nvidia’s Top Technologists Discuss The Future Of GPUs
Power, performance, architectures, and making AI pervasive.
Published on September 10th,  2019 by Ed Sperling And Susan Rambo

More Semiconductor Data Moving To Cloud
A year ago many companies were unwilling to ship their data offsite. What changed?
Published on August 6th,  2019 by Ed Sperling

How Many Test Miles Make A Vehicle Safe?
Simulation and test can improve safety, but that requires a standard framework and definitions.
Published on August 6th,  2019 by Kevin Fogarty

Using Better Data To Shorten Test Time
More sensors plus machine learning are making it possible to focus testing where it has the most impact.
Published on August 6th,  2019 by Ed Sperling

Silicon Photonics Begins To Make Inroads
Maturing processes and new application areas open doors for extremely fast, low-power applications.
Published on July 9th,  2019 by Kevin Fogarty and Ed Sperling

More Top Stories »



Round Tables

New 5G Hurdles
Experts at the Table, part 2: Getting 5G standards and technology ready are only part of the problem. Reducing latency and developing applications ...
Published on August 1st,  2018 by Ed Sperling

Preparing For A 5G World
Experts at the table, part 1: Rising costs, massive complexity, and challenges in testing and simulating these devices will require some fundamenta...
Published on July 12th,  2018 by Ed Sperling

More Roundtables »



Multimedia

Changes In Data Storage and Usage
Managing data lakes, silos, and different data types.
Published on October 9th,  2019 by Ed Sperling

New Challenges In Testing 5G Devices
Complex hurdles in characterizing performance and optimizing signals.
Published on October 7th,  2019 by Ed Sperling

Improving Quality Through Data Analytics
How to utilize data across different manufacturing processes.
Published on September 11th,  2019 by Ed Sperling

Ensuring A 5G Design Is Viable
What's different in 5G vs. 4G.
Published on September 9th,  2019 by Ed Sperling

Using ML For Post-Silicon Validation
Why machine learning is so effective in improving chip designs.
Published on June 11th,  2019 by Ed Sperling

More Multimedia »



See All Posts in Test Measurement and Analytics »

Latest Blogs

Editor's Note

Big Shift In AI Perception
Developers of machine learning are beginning to put a much friendlier face on...
October 8, 2019
by Ed Sperling
Test For The Autonomous Age

The Single Best DFT Move You Can Make
Hierarchical DFT solves many of the biggest challenges in DFT, pattern genera...
by Jay Jahangiri
Scaling Electronics

From Womb To Tomb: A Lifetime Of Chip Data In A Common La...
How ongoing in-chip monitoring reveals ways to optimize performance and addre...
by Noam Brousard
Semiconductor Yield Management

The Unexpected Impact Of Lots On Hold
Unusual ways manufacturing schedules can be derailed.
by Marie Ryan
Inside Big Data

Machine Learning For ADAS Camera Manufacturing
The need for high quality automotive cameras is rising, and new technologies ...
September 16, 2019
by Peter Hodgins
Accelerating Design & Test

Looking To Unlicensed Spectrum For 5G
Large amounts of spectrum are necessary for 5G to meet its potential, but sha...
September 10, 2019
by James Kimery
Extraordinary ASICs

Deprocessing And SEM For Semiconductor Failure Analysis
Finding failure sites that are hidden from optical view.
July 9, 2019
by Helle Ronsberg

Knowledge Centers
Entities, people and technologies explored


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