Author's Latest Posts

Automated Measurement Recipes for Photothermal AFM‑IR
By Bruker - 10 Mar, 2026 - Comments: 0

Recipe‑based automation for atomic force microscopy (AFM) workflows ensures consistent, repeatable data acquisition, reduces operator dependency, and streamlines complex measurement routines. Bruker’s AutoMET automation software, widely adopted for conventional AFM characterization, now also brings automation to nanoscale IR (nanoIR) spectroscopy and imaging. AutoMET provides except... » read more

The Surface Metrology Decision Guide
By Bruker - 10 Feb, 2026 - Comments: 0

The Surface Metrology Decision Guide empowers readers to choose techniques and confidently engage with equipment providers. What’s inside: A side-by-side comparison of the resolution, strengths, and limitations of common surface metrology techniques An in-depth look at advances in and practical considerations for white-light interferometry (WLI) Summary chart of WLI objectives, ma... » read more

Surface Metrology for Hybrid Bonding in Advanced Semiconductor Packaging
By Bruker - 13 Jan, 2026 - Comments: 0

Achieving a reliable hybrid bond requires both surfaces to be pristine. To support this requirement, metrology methods such as atomic force microscopy (AFM) and atomic force profilometry (AFP) are critical for surface characterization and process optimization. AFM delivers localized, high-resolution surface measurements, while AFP provides complementary large-area topography scans that ... » read more

Atomic Force Microscopy: The Definitive AFM Modes Handbook
By Bruker - 08 May, 2025 - Comments: 0

This handbook illustrates the wide variety of operating modes available on Bruker AFMs, going well beyond the standard high‑resolution topographic imaging capabilities of AFM. The modes are broken into seven separate categories: morphology, electromagnetic properties, thermal properties, mechanical properties, chemical properties, electrochemical properties, and manipulation. Each category be... » read more

CMP Process Characterization Using White Light Interferometry
By Bruker - 10 Sep, 2024 - Comments: 0

Faster computer and electronic processors require smaller features for integrated circuits (IC), which in turn require smaller and smoother substrate surfaces. Chemical mechanical polishing (CMP) has become one of the most critical semiconductor fabrication technologies because it offers a superior means of removing unwanted topography in interlevel dielectric layers and achieving sufficient pl... » read more

MEMS Device Cleaning
By Bruker - 06 Jun, 2023 - Comments: 0

Cleaning is an essential process for MEMS applications in order to prevent device failure due to foreign material. Small particles located on MEMS devices are significant causes of device rejection and yield loss. These issues affect inertial devices, such as accelerometers and gyroscopes, as well as microphones, laser bars and other MEMS devices. Click here to download. » read more

Mechanical Characterization Of Ultra Low-k Dielectric Films
By Bruker - 08 Feb, 2023 - Comments: 0

Dielectric materials are of critical importance in the function of microelectronic devices because they electrically isolate conductive components from one another in microcircuits. Capacitance between conductors can limit a circuit’s maximum operating frequency, and the capacitance increases in inverse proportion to the separation distance between the conductors. Therefore, to minimize the s... » read more

IR Laser Imaging Is Rapidly Changing IR Microscopy
By Bruker - 10 Jan, 2023 - Comments: 0

IR laser imaging is finally being commercialized into smart analytical equipment. New applications continue to emerge and yield massive advantages, thanks to the direct combination with FT-IR technology. The application notes below provide valuable insights into three applications of IR laser imaging: Tissue imaging Surface analysis Forensic science Click here to read more. » read more

Super-Resolution Microscopy
By Bruker - 08 Nov, 2022 - Comments: 0

The enhanced resolving power of super-resolution microscope technology enables the imaging and quantitative analysis of cellular dynamics and nanostructures that were previously inaccessible. Download this eBook to learn about: Principles and advantages of super-resolution microscopy (SRM) for life sciences research. Problems solved by SRM Common approaches to achieving be... » read more

Quantification Of Steels And Alloys Using A Dual Source Multidetector System On SEM
By Bruker - 11 Oct, 2022 - Comments: 0

The accurate and precise analysis of steels and alloys is essential for understanding their mechanical and thermal properties. Such materials often have a wide range of elements at various concentrations down to trace ppm levels. Accordingly, it is not possible to determine the concentrations of all elements with a standard scanning electron microscope (SEM) and an energy dispersive spectromete... » read more

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