tag: machine learning

Brute-Force Analysis Not Keeping Up With IC Complexity
By Brian Bailey - 24 Nov, 2020 - Comments: 0

Much of the current design and verification flow was built on brute force analysis, a simple and direct approach. But that approach rarely scales, and as designs become larger and the number of interdependencies increases, ensuring the design always operates within spec is becoming a monumental task. Unless design teams want to keep adding increasing amounts of margin, they have to locate th... » read more

What’s Next In AI, Chips And Masks
By Mark LaPedus - 19 Nov, 2020 - Comments: 0

Aki Fujimura, chief executive of D2S, sat down with Semiconductor Engineering to talk about AI and Moore’s Law, lithography, and photomask technologies. What follows are excerpts of that conversation. SE: In the eBeam Initiative’s recent Luminary Survey, the participants had some interesting observations about the outlook for the photomask market. What were those observations? Fujimur... » read more

Difficult Memory Choices In AI Systems
By Ann Steffora Mutschler - 12 Nov, 2020 - Comments: 0

The number of memory choices and architectures is exploding, driven by the rapid evolution in AI and machine learning chips being designed for a wide range of very different end markets and systems. Models for some of these systems can range in size from 10 billion to 100 billion parameters, and they can vary greatly from one chip or application to the next. Neural network training and infer... » read more

Deploying Accurate Always-On Face Unlock
By Arm - 11 Nov, 2020 - Comments: 0

Accurate face verification has long been considered a challenge due to the number of variables, ranging from lighting to pose and facial expression. This white paper looks at a new approach — combining classic and modern machine learning (deep learning) techniques — that achieves 98.36% accuracy, running efficiently on Arm ML-optimized platforms, and addressing key security issues such a... » read more

Combining Machine Learning With Advanced Outlier Detection To Improve Quality And Lower Cost
By PDF Solutions - 09 Nov, 2020 - Comments: 0

In semiconductor manufacturing, a low defect rate of manufactured integrated circuits is crucial. To minimize outgoing device defectivity, thousands of electrical tests are run, measuring tens of thousands of parameters, with die that are outside of specified parameters considered as fails. However, conventional test techniques often fall short of guaranteeing acceptable quality levels. Given t... » read more

Model Variation And Its Impact On Cell Characterization
By Umang Doshi - 05 Nov, 2020 - Comments: 0

EDA (Electronic Design Automation) cell characterization tools have been used extensively to generate models for timing, power and noise at a rapidly growing number of process corners. Today, model variation has become a critical component of cell characterization. Variation can impact circuit timing due to process, voltage, and temperature changes and can lead to timing violations, resulting i... » read more

Speeding Up AI With Vector Instructions
By Ann Steffora Mutschler - 04 Nov, 2020 - Comments: 0

A search is underway across the industry to find the best way to speed up machine learning applications, and optimizing hardware for vector instructions is gaining traction as a key element in that effort. Vector instructions are a class of instructions that enable parallel processing of data sets. An entire array of integers or floating point numbers is processed in a single operation, elim... » read more

A Machine Learning-Based Approach To Formality Equivalence Checking
By Avinash Palepu - 29 Oct, 2020 - Comments: 0

By Avinash Palepu, Namrata Shekhar and Paula Neeley After a long and hard week, it is Friday night and you are ready to relax and unwind with a glass of wine, a sumptuous dinner and a great movie. You turn on Netflix and you expect that it will not only have plenty of pertinent suggestions for you, but also the most appropriate one based on all the previous movies and shows that you have wat... » read more

Machine Learning Enabled High-Sigma Verification Of Memory Designs
By Nebabie Kebebew - 15 Oct, 2020 - Comments: 0

Emerging applications and the big data explosion have made memory IPs ubiquitous in modern-day electronics. Specifically, the demand for memories with low-die area, low voltage, high capacity, and high performance is rising for use by data center and cloud computing servers. This is essential to serve the exponentially growing connectivity boom and the latest emerging 5G based systems, includin... » read more

One More Time: TOPS Do Not Predict Inference Throughput
By Geoff Tate - 08 Oct, 2020 - Comments: 0

Many times you’ll hear vendors talking about how many TOPS their chip has and imply that more TOPS means better inference performance. If you use TOPS to pick your AI inference chip, you will likely not be happy with what you get. Recently, Vivienne Sze, a professor at MIT, gave an excellent talk entitled “How to Evaluate Efficient Deep Neural Network Approaches.” Slides are also av... » read more

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