Special Reports

Chasing Reliability In Automotive Electronics

By: Susan Rambo And Ed Sperling

Supply chain changes, resistance to sharing data and technology unknowns add up to cont...
What’s the Right Path For Scaling?

By: Mark LaPedus

New architectures, packaging approaches gain ground as costs increase, but shrinking fe...
The Cost Of Accuracy

By: Brian Bailey

Accuracy is a relative term that complicates design and verification. Machine learning ...

 more »

Top Stories

Taming Concurrency

 What hoops will designers have to jump though to avoid concurrency bugs?
January 17th, 2019 By Brian Bailey

Mostly Upbeat Outlook For Chips

 2019 will be a year of change for the semiconductor industry as new fields drive techno...
January 17th, 2019 By Brian Bailey

Process Variation And Aging

 Experts at the Table, part 2: How the very fast progress of the semiconductor industry ...
January 17th, 2019 By Ann Steffora Mutschler

AI’s Growing Impact On Chip Design

 Synopsys' chairman looks at what really got the AI explosion rolling and what it means ...
January 16th, 2019 By Ed Sperling

Machine Learning For IC Production

 Experts at the Table, part 3: Where can this technology be applied and what’s ahead.
January 16th, 2019 By Mark LaPedus

More 2.5D/3D, Fan-Out Packages Ahead

 Progress on 3D-ICs, using HBM with fan-outs, and other new approaches.
January 15th, 2019 By Mark LaPedus

The Next Semiconductor Revolution

 Four industry experts talk about what's changing, how quickly, and where the limits are...
January 15th, 2019 By Ed Sperling

IoT Merging Into Data-Driven Design

 Emphasis on processing at the edge adds confusion to the IoT model as the amount of dat...
January 10th, 2019 By Ed Sperling and Kevin Fogarty

Making Autonomous Vehicles Safer

 What needs to be tested, and what's the best way to make that happen?
January 10th, 2019 By Kevin Fogarty

IoT Device Security Makes Slow Progress

 Experts at the Table: While attention is being paid to security in IoT devices, still m...
January 10th, 2019 By Ann Steffora Mutschler

Chip Industry In Rapid Transition

 Wally Rhines, Mentor's CEO Emeritus, points to big shifts caused by AI, customization, ...
January 9th, 2019 By Ed Sperling

Reducing Advanced Packaging Costs

 Experts at the Table, Part 2: What's needed to make different packaging approaches more...
January 9th, 2019 By Ed Sperling

more top stories »


Latest News

Blog Review: Jan. 16

 FPGAs adopt formal; RISC-V cores; the importance of seals.
January 16th, 2019 By Jesse Allen

Week In Review: Manufacturing, Test

 SEMI’s ISS recap; ATE concerns; trouble at Russian foundry?
January 11th, 2019 By Mark LaPedus

Week in Review: IoT, Security, Auto

 IoT advances; German hacking; Faraday’s future.
January 11th, 2019 By Jeff Dorsch

Week In Review: Design, Low Power

 QuickLogic buys sensor software startup; hybrid DSP/controller...
January 11th, 2019 By Jesse Allen

more news »



Research

Manufacturing Bits: Jan. 14

 Tracking cell movement; skin structure; super microscopy.
By Mark LaPedus

System Bits: Jan. 14

 Integrated photonics; cloud alternative; ultra-sensitive sensor.
By Jeff Dorsch

Power/Performance Bits: Jan. 14

 Optical memory; millimeter wave light modulator; origami RF fi...
By Jesse Allen

more research »



Startup Corner

Kumu Networks: Full Duplex on One...

 Well-funded startup offers self-interference cancellation tech...
By Jeff Dorsch

more startups »

STOCK MARKET NEWS

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Source: Premium Stock Market Widgets

Disclaimer:Semiconductor Engineering/Sperling Media Group LLC expressly disclaims the adequacy, accuracy, or completeness of any data and shall not be liable for any errors, omissions or other faults in, delays or interruptions in such data, or for any actions taken in reliance thereon.

Videos


AI In Chip Manufacturing

January 15th, 2019


Edge Inferencing Challenges

January 10th, 2019


Making Sense Of DRAM

December 13th, 2018


More Than A Core

December 10th, 2018

Knowledge Centers / Entities, people and technologies explored

EDITORS
Ed Sperling

Ed Sperling

Editor in Chief
Mark LaPedus

Mark LaPedus

Executive Editor/ Manufacturing
Ann Steffora Mutschler

Ann Steffora Mutschler

Executive Editor/EDA
Susan Rambo

Susan Rambo

Managing Editor
Brian Bailey

Brian Bailey

Technology Editor/EDA
Ernest Worthman

Jeff Dorsch

Technology Editor
Katherine Derbyshire

Katherine Derbyshire

Technical Editor/Materials Engineering
Jesse Allen

Jesse Allen

Senior Editor/KC Administrator
Kevin Fogarty

Kevin Fogarty

Technology Editor

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