category: Top Stories

category: Auto, Security & Edge AI

With Chiplets, What Role Does Economics Play?
By Bryon Moyer - 21 May, 2026 - Comments: 0

Key Takeaways: For the data center, chiplet economics matter, but they’re not a primary decision-driver. With the exception of processor families, chiplets cannot address consumer markets today, where economics dominate. If a chiplet marketplace materializes, the economics may be friendlier because chiplets will have multiple customers and applications. Chiplets are notori... » read more

Low-Temp Solders Are Suddenly Critical For Chiplets And Photonics
By Laura Peters - 21 May, 2026 - Comments: 0

Key Takeaways: Tin-bismuth-based solders enable reduced warpage and compatibility with silicon photonics and other temperature-sensitive components. A novel soldering process using white light could help prevent cracks in flip-chip BGA package solder balls, while reducing the carbon footprint. Hypoeutectic Sn-Bi based solders prove especially promising as an SAC305 replacement. ... » read more

Mask Technology Faces A New Set Of Challenges
By Gregory Haley - 21 May, 2026 - Comments: 0

Key Takeaways: Mask inspection and repair remain the critical bottleneck, even as multi-beam writers have reduced mask-writing constraints. Curvilinear masks are becoming viable for critical layers, but qualification, metrology, and inspection standards still lag production needs. Scaling curvilinear requires curvilinear-native data flows, model-based checks, GPU/HPC compute, and les... » read more

Options Grow For Standardizing Data Movement And Sharing Resources
By Ed Sperling - 20 May, 2026 - Comments: 0

Semiconductor Engineering sat down to discuss memory interfaces, interconnects, and memory access scaling with Madhumita Sanyal, senior director of technical product management at Synopsys; Swadesh Choudhary, senior principal engineer at Intel; Siamak Tavallaei, senior principal engineer at Samsung SSI; and Mohsen Asad, senior director of technology at Credo. What follows are excerpts of a disc... » read more

Confusion Grows With More Interconnect Options And Tradeoffs
By Liz Allan - 18 May, 2026 - Comments: 0

Key Takeaways: Designers are frequently evaluating 5 or more different interconnects in a single system, each with a distinct purpose. While chip-to-chip (PCIe) and die-to-die (UCIe, BoW) technologies seem to be solving a similar problem, in practice they bring different challenges. PCIe, CXL, NVLink, and UALink are all active in the hyperscaler space, but Ethernet-based technologies... » read more

Chiplets Need A New Workflow
By Ann Mutschler - 14 May, 2026 - Comments: 0

Key Takeaways: Chiplet design turns semiconductor development into a system-level problem, requiring coordinated workflows across design, packaging, verification, test, and reliability. Successful chiplet workflows must handle multi-physics challenges — especially thermal, mechanical, power, and signal integrity — early enough to reduce costly failures before assembly and tape-out. ... » read more

Gates Add Functionality, But Wires Create Problems
By Brian Bailey - 14 May, 2026 - Comments: 0

Key takeaways: While transistors see continuous improvement, wires keep getting worse because of the smaller geometries and larger chip sizes. There are limited ways to avoid such problems, but the biggest impact will come from floorplanning. Analysis today is not adequate. New developments, such as backside power and 3D integration, provide temporary relief but new materials are a d... » read more

AI Accelerator Testing Depends On DFT Innovations
By Laura Peters - 12 May, 2026 - Comments: 0

Key Takeaways: I/O and lane repair capabilities are becoming critical to improving yield. System-level testing catches marginal defects and rare defects such as silent data corruption errors. Synopsys and TSMC developed a multi-die demo vehicle capable of full test, monitor, debug, and repair capability across the system’s lifecycle. The proliferation of accelerators in AI... » read more

Smart Test Collides With The Data Chain
By Gregory Haley - 12 May, 2026 - Comments: 0

Key Takeaways: The promise of smart test is a data-chain problem before it is an algorithm problem. A device can pass every checkpoint and still carry a latent defect the test record never captured. As test grows more adaptive, the validity of the measurement environment matters as much as the measurement itself. For years, the test roadmap has pointed toward more adaptive f... » read more

HBM Shifts Testing Left To Preserve AI Chip Yield
By Anne Meixner - 12 May, 2026 - Comments: 1

Key Takeaways: A high-yield, known-good stack requires multiple test insertions. Known good stack testing poses challenges for power delivery and thermal management. The shift to HBM4 and HBM5 will increase the pressure for shift-left test flows. Taller high-bandwidth memory (HBM) stacks and tighter TSV pitch are impacting AI module yields. The solution is to push test furth... » read more

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