Making On-Chip Photonics Manufacturable


Key Takeaways: System-level energy and bandwidth pressures are pulling optics into the package faster than the manufacturing flow can mature. Photonics combines front-end fabrication, materials, thermal, cleanliness, and test into one problem that can’t be solved domain by domain. Test is moving upstream because discovering an optical failure after final assembly forfeits every goo... » read more

Chiplets Need A New Workflow


Key Takeaways: Chiplet design turns semiconductor development into a system-level problem, requiring coordinated workflows across design, packaging, verification, test, and reliability. Successful chiplet workflows must handle multi-physics challenges — especially thermal, mechanical, power, and signal integrity — early enough to reduce costly failures before assembly and tape-out. ... » read more

Powering AI At Scale: Why 3D-ICs Demand A New Approach To Power Integrity


By Muhammad Hassan and Sudarshan Deo The semiconductor industry is undergoing a fundamental transition. Performance scaling is no longer driven primarily by transistor density, but by advanced packaging—2.5D, 3D-ICs, chiplets, and heterogeneous integration. Fig. 1: 3D-IC and 2.5D structure. These architectures are essential to meeting the extreme performance and bandwidth demands... » read more

2.5D + 3D = “3.5D”!


The semiconductor industry is no longer defined solely by transistor scaling. As Moore's law decelerates, advanced packaging has become the primary lever for achieving system-level performance gains. Within this landscape, the equation 2.5D + 3D = 3.5D—defying the instincts of basic math and physics—captures a pivotal architectural evolution: one that balances performance, manufacturabilit... » read more

Power Integrity Without Blind Spots: A System Level Approach To 3D-ICs


Power delivery has become one of the defining challenges of next-generation semiconductor systems. As AI, high-performance computing, and data-centric workloads drive higher performance and tighter integration, traditional 2D SoC design approaches are reaching their limits. The industry’s shift toward 2.5D and 3D heterogeneous integration promises breakthroughs in performance and efficiency�... » read more

Beating The Heat In 3D Packages


Key Takeaways: Thermal management is a central design constraint, requiring early, thorough planning. Accurate thermal simulation requires AI-driven adaptive meshing and real-world validation. Innovative STCO strategies can drastically reduce GPU peak temperature. As HPC and AI accelerators push power densities to 1kW and beyond, the heat generated by rapidly switching tran... » read more

System-level Reliability Verification for 2.5D/3D ICs Using Innovator3D IC and Calibre 3DPERC


The increasing demand for higher performance, lower power, and greater functionality in smaller packages has driven the rapid adoption of 2.5D and 3D Integrated Circuits (ICs). However, the inherent complexity of these multi-die architectures presents significant reliability verification challenges that traditional 2D flows cannot adequately address, particularly concerning electrostatic discha... » read more

Catching Critical Defects In TSVs And Stacked Chips


Key Takeaways Variation is becoming a bigger problem in multi-die assemblies with TSVs and hybrid bonding. Multi-modal approaches are required to test these devices. AI plays a role in improving defect capture rate and distinguishing between yield-killing and false positives. New methods for interconnecting devices using through-silicon vias (TSVs) and hybrid bonding in stac... » read more

Why Move To 2nm?


Key Takeaways: Scaling digital logic still provides significant benefits, especially lower power. Multi-die assemblies will be the predominant approach, and most of the circuitry will not be 2nm or below. While these systems are inherently more flexible, the number and complexity of tradeoffs required for optimizing PPA/C are increasing. The rollout of 2nm process nodes and ... » read more

Chiplet Fundamentals For Engineers: eBook


Multi-die assemblies are the next phase of Moore's Law, scaling up and out  to improve performance and add flexibility into designs. By decomposing SoCs into building blocks, yield improves for the individual dies and overall performance increases because a chip is no longer bound by reticle limits. But this is much harder than it sounds. Chiplets don't just snap together like LEGOs, and so... » read more

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