category: The Human Machine Interface

category: Auto, Security & Edge AI

Test Distribution Evolves To Meet AI Challenges
By Fabio Pizza - 12 May, 2026 - Comments: 0

The proliferation of artificial intelligence (AI) is driving rapid acceleration of the semiconductor market, which analysts now predict will reach $1 trillion this year. Many semiconductor devices will be the GPUs that populate the data centers that run AI workloads. Driven by strong, sustained investments from hyperscaler operators, high-performance computing (HPC)/AI data centers are expected... » read more

Harnessing Digital Twins And AI/ML For Smarter Semiconductor Test Optimization
By Vincent Chu - 07 Apr, 2026 - Comments: 0

As semiconductor devices become increasingly complex, the challenge of testing them efficiently and accurately grows in parallel. Traditional testing methods—rooted in static test plans—often fall short in dealing with the nuances of today's advanced integrated circuits (ICs), especially in high-volume manufacturing environments. In response, the industry is exploring real-time, data-dri... » read more

Singulated Die Test Ensures Stacked Die Quality As Power Density Rises
By Brent Bullock - 10 Mar, 2026 - Comments: 0

The accelerating rate at which the industry adopts new process nodes is posing critical test challenges. Shrinking geometries combined with increased design complexity with respect to metrics such as gates per square micrometer, plus higher operating frequencies, are leading to ever higher levels of power density. The resulting device thermal excursions are driving the need for singulated die t... » read more

Tackling Chip Complexity With Integrated System-Level Test Solutions
By Davette Berry - 09 Dec, 2025 - Comments: 0

As the sophistication of semiconductors continues to grow, so does the need for system-level test (SLT) in production to ensure that high-performance processors, chiplets, and other advanced devices function as expected in real-world environments. Once seen primarily as a fallback to catch what traditional automated test equipment (ATE) missed, SLT has now become a mission-critical step for val... » read more

AI Memory: Enabling The Next Era Of High-Performance Computing
By Tadashi Oda - 11 Nov, 2025 - Comments: 0

The rapid advancement of artificial intelligence (AI) is driving unprecedented demand for high-performance memory solutions. AI-driven applications are fueling significant year-over-year growth in high-bandwidth memory (HBM). However, as AI models grow in complexity—from large language models (LLMs) to real-time inference applications—the need for faster, higher-bandwidth, and energy-effici... » read more

Rethinking Security In Semiconductor Testing: Why Containment Is The New Imperative
By Arik Peltz - 14 Oct, 2025 - Comments: 0

It’s nearly impossible to keep up with the headlines without stumbling upon another major cybersecurity incident. According to recent reports, 2024 witnessed a staggering 5.5 billion breaches globally. In the United States alone, the average cost of a single data breach clocked in at $9.36 million—slightly lower than 2023’s figure, but still a significant hit for any organization. On a gl... » read more

Data Feed Forward And How It Works: Part 2
By Roberto Colecchia - 09 Sep, 2025 - Comments: 0

As chiplets and advanced packaging redefine semiconductor architecture, managing complexity isn’t just about the silicon—it’s about the data. Modern multi-die packages often contain components from different vendors, integrated in 2.5D or 3D configurations. Each die brings its own risks, and diagnosing issues after assembly is increasingly difficult—especially when data isn’t share... » read more

Data Feed Forward And How It Works: Part 1
By Roberto Colecchia - 12 Aug, 2025 - Comments: 0

With data analytics, manufacturers can gain unparalleled insights into their testing processes, identify patterns, predict failures, and optimize operations. From improving yield rates to reducing testing costs, data analytics not only enhance the quality of semiconductor devices but also drives innovation and competitiveness in the industry. Traditionally, data analytics has been performed ... » read more

The Data Dilemma In Semiconductor Testing And Why It Matters: Part 2
By Roberto Colecchia - 10 Jul, 2025 - Comments: 0

In Part 1, we explored the challenges of implementing machine learning and real-time analytics in semiconductor testing—chiefly, the difficulty of transferring device test data across multiple locations and organizations. In this post, we introduce Data Feed Forward (DFF) as it applies to ACS Advantest. What is ACS DFF? ACS DFF is a cloud-enabled solution designed to simplify, secure... » read more

The Data Dilemma In Semiconductor Testing And Why It Matters: Part 1
By Roberto Colecchia - 10 Jun, 2025 - Comments: 0

In today’s semiconductor industry, machine learning (ML) is no longer a buzzword — it’s an operational necessity. From optimizing test flows to identifying device drifts and executing advanced analytics like VMIN or trimming, ML-based applications are increasingly used to boost yields, improve quality, and lower test costs. But there’s a catch. To make these intelligent applications ... » read more

← Older posts

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2026 SMG   |  Terms of Service  |  Privacy Policy