category: Next-Generation Test

category: Auto, Security & Edge AI

The AI Server Challenge: Testing Power At Scale
By Aik-Moh Ng - 12 May, 2026 - Comments: 0

Artificial intelligence is most often framed as a story of compute advancements. Faster GPUs, denser accelerators, and advanced process nodes. But behind every AI workload, the most fundamental constraint is power. Fig. 1: AI server market. Source: Grand View Research As AI servers scale to meet data center demand, power delivery is becoming one of the most critical and complex engine... » read more

How AI Is Changing Computing And Why Testing Is Critical
By Jeorge Hurtarte - 10 Mar, 2026 - Comments: 0

Artificial intelligence (AI) is transforming industries, enhancing our daily lives, and improving efficiency and decision-making, but its need for compute processing power is growing at an astonishing rate, doubling every three months (Figure 1). To maintain this pace, the semiconductor industry is moving beyond traditional chip development – it has entered the era of heterogeneous chiplets i... » read more

High-Throughput Image Sensors: Smart Testing Powers Progress
By Alexander Metzdorf - 13 Jan, 2026 - Comments: 0

In the race to produce higher resolution image sensors—now pushing beyond 500 megapixels—the industry faces significant challenges. These sensors aren’t just capturing more pixels; they’re handling massive streams of data, validating intricate on-chip AI functions, and doing it all at breakneck speeds. For manufacturers, the challenge is as unforgiving as it is critical: test more compl... » read more

Invisible Interfaces: The Hidden Challenge Behind Every Great Image Sensor
By Alexander Metzdorf - 09 Dec, 2025 - Comments: 0

When you snap a photo on your phone or rely on a car’s camera for lane detection, you’re trusting an unseen network of technologies to deliver or interpret image data flawlessly. But behind the scenes, the interface between the image sensor and its processor is doing the heavy lifting, moving megabtyes of data without error or delay. While much of the industry conversation focuses on adv... » read more

Solving Today’s Toughest Test Challenges: A New Era Of Engineering Productivity
By Ed Seng - 11 Nov, 2025 - Comments: 0

Today’s test engineers face unprecedented demands as semiconductor designs grow more complex and product cycles accelerate. Advanced packaging, chiplet architectures, and AI accelerators are reshaping the landscape, yet engineering resources remain fixed. Traditional approaches to scaling productivity by adding headcount no longer apply. While cost of test is always a consideration, ensuri... » read more

Redefining Sustainability: Operational Resilience Is the New Frontier
By Mike Halblander - 12 Aug, 2025 - Comments: 0

Powering everything from smartphones, energy infrastructure, electric transport, and AI systems, semiconductors have become a cornerstone of economic innovation. However, rapid progress has an impact. One recent survey shows that the semiconductor device manufacturing industry more than doubled its annual electricity consumption between 2015 and 2023 – an increase of 125% during that period. ... » read more

Testing At The Speed Of Light: Enabling Scalable Optical Testing For Silicon Photonics And CPO
By Matthew Griffin - 10 Jul, 2025 - Comments: 0

Today, a single ChatGPT query consumes roughly ten times more power than a traditional Google search and will only continue to grow as AI extends to image and video generation. With this growth not only in AI, but also in cloud computing and high-performance computing (HPC), data center electricity consumption is projected to account for up to 9.1% of total U.S. electricity use by 2030. ... » read more

Chip Complexity Drives Innovation In Automated Test Equipment
By Jeorge Hurtarte - 08 May, 2025 - Comments: 0

Innovations in semiconductor technology—such as advancements in AI high-performance computing (HPC), Angstrom-scale silicon process nodes, silicon photonics, and automotive xEV wideband gap power transistor applications—require automated test equipment (ATE) to evolve at an unprecedented rate. As chip complexity grows, the challenges in design, manufacturing, and test multiply. It is a comp... » read more

Silicon Photonics Raises New Test Challenges
By Jeorge Hurtarte - 11 Mar, 2025 - Comments: 0

Semiconductor devices continuously experience advancements leading to technology and innovation leaps, such as we see today for applications in AI high-performance computing for data centers, edge AI devices, electric vehicles, autonomous driving, mobile phones, and others. Recent technology innovations include Angstrom-scale semiconductor processing nodes, high-bandwidth memory, advanced 2.5D/... » read more

Industry Standards For Chiplets And Their Role In Test
By Jeorge Hurtarte - 14 Jan, 2025 - Comments: 0

As the semiconductor industry increasingly moves to chiplets, 2.5D/3D packaging, and heterogeneous integration, there are significant new challenges for test. Leaders like Teradyne have the technologies necessary to respond and innovate, but to keep the industry running smoothly, we need effective collaboration, and that demands standardization. Source: Arizona State University There ... » read more

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