category: Round Tables

category: IoT, Security & Automotive

Who Is Most Likely To Link Financial And Manufacturing Data?
By Anne Meixner - 08 May, 2025 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss which companies have the most to gain from linking financial data with manufacturing data analytics platforms with Dieter Rathei, CEO of DR Yield; Jon Holt, senior director of product management at PDF Solutions, Alex Burlak, vice president of advanced analytics and test at proteanTecs; and Dirk de Vries, technical program ma... » read more

Secure Handling Of Financial Data In Manufacturing
By Anne Meixner - 21 Apr, 2025 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss the advantages associated with linking financial data with manufacturing data analytic platforms, real security challenges and the best uses for AI/ML methods, with Dieter Rathei, CEO of DR Yield; Jon Holt, senior director of product management at PDF Solutions, Alex Burlak, vice president of advanced analytics and test at p... » read more

Chip Failures: Prevention And Responses Over Time
By Ed Sperling - 19 Mar, 2025 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss the causes of chip failures, how to respond to them, and how that can change over time, with Steve Pateras, vice president of marketing and business development at Synopsys; Noam Brousard, vice president of solutions engineering at proteanTecs; Harry Foster, chief verification scientist at Siemens EDA; and Jerome Toublanc, hi... » read more

Optimizing DFT With AI And BiST
By Gregory Haley - 12 Feb, 2025 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to explore how AI impacts design for testability, with Jeorge Hurtarte, senior director of product marketing in the Semiconductor Test Group at Teradyne; Sri Ganta, director of test products at Synopsys; Dave Armstrong, principal test strategist at Advantest; and Lee Harrison, director of Tessent automotive IC solutions at Siemens EDA. Wh... » read more

DFT At The Leading Edge
By Gregory Haley - 14 Jan, 2025 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss the rapidly changing landscape of design for testability (DFT), focusing on the impact of advancements in fault models, high-speed interfaces, and lifecycle data analytics, with Jeorge Hurtarte, senior director of product marketing in the Semiconductor Test Group at Teradyne; Sri Ganta, director of test products at Synopsys; D... » read more

Why Chips Fail, And What To Do About It
By Ed Sperling - 11 Dec, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss reliability of chips in the context of safety- and mission-critical systems, as well as increasing utilization due to an explosion in AI data, with Steve Pateras, vice president of marketing and business development at Synopsys; Noam Brousard, vice president of solutions engineering at proteanTecs; Harry Foster, chief verificat... » read more

New Challenges In IC Reliability
By Ed Sperling - 15 Oct, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss reliability of chips, how it is changing, and where the new challenges are, with Steve Pateras, vice president of marketing and business development at Synopsys; Noam Brousard, vice president of solutions engineering at proteanTecs; Harry Foster, chief verification scientist at Siemens EDA; and Jerome Toublanc, high-tech soluti... » read more

What’s Missing In Test
By Anne Meixner - 19 Jun, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss how functional test content is brought up at first silicon, and the balance between ATE and system-level testing, with Klaus-Dieter Hilliges, V93000 platform extension manager at Advantest Europe; Robert Cavagnaro, fellow in the Design Engineering Group at Intel (responsible for manufacturing and test strategy of data center... » read more

Doing More At Functional Test
By Anne Meixner - 14 May, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss the increasing importance of functional test, especially in high-performance computing, with Klaus-Dieter Hilliges, V93000 platform extension manager at Advantest Europe; Robert Cavagnaro, fellow in the Design Engineering Group at Intel (responsible for manufacturing and test strategy of data center products); Nitza Basoco, tec... » read more

Inspection, Metrology Issues In Advanced Packages
By Gregory Haley - 08 Feb, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to talk about how to inspect and measure smaller features across large areas in advanced packaging, with Frank Chen, director of applications and product management at Bruker Nano Surfaces & Metrology; John Hoffman, computer vision engineering manager at Nordson Test & Measurement; and Jiangtao Hu, senior technology director at O... » read more

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