Improving Test Coverage And Eliminating Test Escapes Using Analog Defect Analysis


While the analog and mixed-signal components are the leading source of test escapes that result in field failures, the lack of tools to analyze the test coverage during design has made it difficult for designers to address the issue. In this white paper, we explore the methodology for performing analog fault simulation of test coverage based on defect-oriented testing. In addition, we look at h... » read more

Putting “Design” Back Into Design For Test In PCB Products


Design for manufacturing (DFM) has become a proactive part of the design process, but the same cannot be said for DFT. Whereas “left-shifting” DFM has reduced manufacturing problems, increased yield, reduced scrap levels, and simplified engineering rework, testability-related improvements have stayed flat during that same time. Unfortunately, as assembly costs have come down, and test-relat... » read more

Software-Defined Test And Measurement


Software-defined radios, instrumentation and test are ramping up alongside a flood of new technologies related to assisted and autonomous vehicles, 5G, and military/aerospace electronics, breathing new life and significant change into the test and measurement market. Software-defined test adds flexibility in markets where the products and protocols are evolving or still being defined, and wh... » read more

How Automotive ICs Are Reshaping Semiconductor Test


The growth of a new IC market creates ripples along the entire supply chain. Today, we see the semiconductor industry reacting to the needs of the growing automotive IC market, including the development of new IC test tools and methods. The automotive IC market is far and away the fastest growing end-use market with 15% CAGR (according to IC Insights). It is also seeing many new players. Mar... » read more

Tech Talk: Faster Simulation


Cadence’s Adam Sherer talks about how to speed up simulation in complex multi-core designs. https://youtu.be/lDgMwU5KN7U » read more

DO-254: Increasing Verification Coverage By Test


Verification coverage by test is essential to satisfying both the objectives of DO-254 and interpretation in FAA Oder 8110.105. However, verification of requirements by test during final board testing is challenging and time-consuming in most cases. This white paper explains the reasons behind these challenges and provides recommendations for how to overcome them. The recommendations center ... » read more

What’s In The Package?


Putting a variety of chips or hardened IP blocks into a package rather than trying to cram them into a single chip continues to gain ground. But it's also creating its own set of issues around verifying and testing these devices. This problem is well understood inside of SoCs, where everything is integrated into a single die. And looked at from a 30,000-foot perspective, packaging is someth... » read more

NI Trend Watch 2018


Technology has never progressed faster than it is today, so we must think critically about where we’re headed and how we’ll get there. The NI Trend Watch provides insight into some of the biggest trends and challenges engineers will face as we accelerate into our future faster than ever before. To read more, click here. » read more

Test Innovations For ISO 26262


We are witnessing the gradual transition of the automobile from a simple means of transportation to a mobile electronic hub. The amount of electronic content in passenger cars continues to grow rapidly. Recent reports indicate that electronics now contribute about 40% of the total costs of a traditional internal-combustion-engine car, and this jumps as high as 75% for the growing number of elec... » read more

Achieving ISO 26262 Software Tool Confidence For Improved Automotive Functional Safety


Achieving ISO 26262 Software Tool Confidence for Improved Automotive Functional Safety The rapid adoption of advanced electronic systems in automobiles has prompted the automotive industry to develop the ISO 26262 functional safety standard to address the potential risks associated with failures in these systems. ISO 26262 is derived from the more general IEC 61508 standard and defines requirem... » read more

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