Top Stories

AI/ML’s Role In Design And Test Expands
But it’s not always clear where it works best or how it will impact design-to-test time.

Metrology And Inspection For The Chiplet Era
Recent developments address imminent needs of advanced nodes and packages, but not all the pieces are in place yet.

Driving Cost Lower and Power Higher With GaN
Best practices continue to develop alongside an increased adoption of gallium nitride power devices.

Blogs

Onto Innovation’s Prasad Bachiraju explains how to turn reactive root cause analytics into proactive monitoring to avoid the advancement of defective die, in Achieving Zero Defect Manufacturing Part 2: Finding Defect Sources.

Synopsys’ Faisal Goriawalla digs into HBM4 test challenges and why it’s important to detect defects before system failure, in Are You Ready For HBM4? A Silicon Lifecycle Management (SLM) Perspective.

NI’s Jake Harnack and Alejandro Escobar Calderon find that a combination of phase-based ranging and time-of-flight measurements increases distance measurement accuracy, in Bluetooth’s New Era: The Role Of Channel Sounding And Adaptable Testing Solutions.

Teradyne’s Fisher Zhang discusses the auto industry’s push towards smaller process nodes and the challenges that necessitate early and continuous engagement with testing, in Semiconductor Shifts In Automotive: Impact Of EV And ADAS Trends.

Advantest’s Ira Leventhal shows how AI and ML algorithms are used to identify patterns and anomalies that might not be discovered by human testers or traditional methods, in Leveraging AI To Efficiently Test AI Chips.

Sponsor White Papers

Controller Area Network (CAN) Overview
CAN as an in-vehicle network.

Expediting Manufacturing Safe Launch With Big Data AI/ML Analytic Solutions On The Cloud
Using a cloud yield tool to expedite yield learning, test time reduction (TTR) and quality enhancement.

Newsletter Signup

Find our email newsletter signup page here.