Top Stories

Reducing Costly Flaws In Heterogeneous Designs
Why finding and fixing errors in AI and automotive chips is so difficult.

Shrinking AV’s 1 Billion Test Miles
What makes an autonomous vehicle safe in real-world traffic situations?

Testing Against Changing Standards In Automotive
There is no right answer yet for autonomous vehicles, and that’s causing problems.

Blogs

Editor In Chief Ed Sperling finds machine learning developers are putting a much friendlier face on the technology these days, in Big Shift In AI Perception.

Mentor’s Jay Jahangiri describes how a hierarchical DFT solves many of the biggest challenges in DFT, pattern generation, and diagnosis for today’s large SoCs, in The Single Best DFT Move You Can Make.

proteanTec’s Noam Brousard explains how in-chip monitoring can help optimize performance and address failures before they occur, in From Womb To Tomb: A Lifetime Of Chip Data In A Common Language.

YieldHub’s Marie Ryan points to some unusual ways that manufacturing schedules can be derailed, in The Unexpected Impact Of Lots On Hold.